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HomeSolid State PhenomenaSolid State Phenomena Vol. 55Band Gap Measurement of the Sintered Cdx Se1-x...

Band Gap Measurement of the Sintered Cd_x Se_1-x Films from Reflectance Measurement

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Semiconductor Materials and Technology (ICSMT)

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Periodical:

Solid State Phenomena (Volume 55)

Pages:

40-42

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.55.40

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Online since:

August 1997

Authors:

S.K. Sharma, Vijay Kumar, S.K. Kaushish, T.P. Sharma

Keywords:

Bandgap, Reflection, Sintering, X-Ray Diffraction Pattern

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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