Study of Gate Length, Channel Length and Gate-Source Spacing on the GaAs MESFET Characteristics

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Periodical:

Solid State Phenomena (Volume 55)

Edited by:

R.M. Mehra and P.C. Mathur

Pages:

26-28

DOI:

10.4028/www.scientific.net/SSP.55.26

Citation:

N. Dasgupta and S. Murthy G.B, "Study of Gate Length, Channel Length and Gate-Source Spacing on the GaAs MESFET Characteristics", Solid State Phenomena, Vol. 55, pp. 26-28, 1997

Online since:

August 1997

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$35.00

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