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Furthermore, the preferred orientation of the atomic planes was determined by texture coefficient (TC) [18]: (8) where Ihkl is the measured integrated intensity, Io,hkl is the relative integrated intensity from the JCPDS card, and n is the number of diffraction peaks.
If all (hkl) planes have TC ≈ 1, the atomic planes are randomly oriented similar to the ZnO from JCPDS card.
Obviously, the positions of the XRD peaks were correspond to the peak positions of ZnO (JCPDS card no. 36-1451) and Fe from the substrate (JCPDS card no. 6-696).
In addition, the calculated lattice constants (a and c) of ZnO were shown on Table 2, and were in consistent with the lattice constants of ZnO from JCPDS card no. 36-1451.
Moreover, those values approach the c/a ratio, bond length, and bond angles of bulk ZnO from JCPDS card no. 36-1451.

The ZnO powders containing Ag loadings between 1 and 9 mol%, clearly showed two different characteristic diffraction patterns of the ZnO crystals in a wurtzite structure (JCPDS card number 36-1451) and a cubic structure of metallic Ag (JCPDS card number 87-0718).
On the other hand, when the Ag loading exceeded 9 mol%, the XRD pattern showed an additional XRD peak or third phase that closely matched the cubic Ag2O (JCPDS card number 41-1104).
The comparison of the degradation efficiency for ZnO powders with various Ag loadings after being irradiated for 1 h and comparison with a commercial ZnO (com.ZnO) powder.
The Ag on the surface of ZnO is in a metallic form and helps to enhance the photocatalytic activity of the ZnO powders.
Acknowledgments This research is supported by The Thailand Research Fund (TRF), Office of the Higher Education Commission and Prince of Songkla University under contract number MRG5480071.

Fig. 3 (a) The structure of ZnO rod and (b) The schematic of ZnO plate structure in existence of Cl .
Most the peaks of the samples can be indexed to the wurtzite phase structured ZnO (a=3.249 Å, c=5.206 Å, JCPDS card No.36-1451) and Al (JCPDS card No.89-2837).
These peaks appear to be in better match with the XRD reference pattern of the hydroxyl compound Zn5(OH)8Cl2•H2O(or ZnCl2•4Zn(OH)2•H2O, JCPDS card 7-155), and Zn(OH)2 (JCPDS card No.38-385).
This polarity is responsible for a number of the properties of ZnO, including its piezoelectricity and spontaneous polarization, and is also a key factor in crystal growth, etching and defect generation.
The four most common face terminations of wurtzite ZnO are the polar Zn terminated and O terminated faces (c-axis oriented), and the non-polar (a-axis) and faces which both contain an equal number of Zn and O atoms (Fig. 4(a)).

There are a few reports about ZnO applied in QDSSCs.
The photoanode materials of the above mentioned solar cells are all ZnO nanorods or ZnO Nanowires, here we prove that ZnO porous plate films can also be used in QDSSCs.
The corresponding XRD pattern (in Figure 2 (a)) exhibits the plate film is a mixture of ZnO (JCPDS card number 76-704) and Zn5(OH)8Cl2•H2O (JCPDS card number 07-155).
(c) I-V characteristics of porous ZnO/CdS QDSSCs.
However, after heat treatment at 500°C for 5h, the sample totally changed to ZnO (JCPDS card number 76-704).

Effect of K2O Addition on Crystallization and Microstructure of Li2O-ZnO-Al2O3-SiO2 System Glass-Ceramics Z.B.
The Li2O-ZnO-Al2O3-SiO2 system glasses with varying content of K2O were prepared.
In principle, a number of glass-ceramic systems could be used to give the characteristics required for sealing to metals and alloys.
Materials from the Li2O-ZnO-Al2O3-SiO2 system do, however offer a number of distinct advantages over other candidates.
For glass K0, the crystallization of β1-Li2ZnSiO4 (JCPDS card no.24-0679) at the first exothermic peak temperature is followed by that of Li2Al2Si3O10 (JCPDS card no.25-1183) upon heating to the second peak temperature.The transformation of β1-Li2ZnSiO4 to the more stable phase γ0- Li2ZnSiO4 (JCPDS card no.24-0677) occurs at the third exothermic peak temperature (Fig. 2 (a)).

From Fig. 1 (a), it was observed that the diffraction peaks of all samples exhibited a hexagonal ZnO wurtzite structure according to the JCPDS card number of 36-1451.
Therefore, a number of small micelles occurred and the small ZnO particles were generated.
The XRD patterns of all La-doped ZnO nanoparticles exhibited a hexagonal ZnO wurtzite structure corresponding to the JCPDS card number of 36-1451.
Summary The spherical ZnO and La-doped ZnO nanoparticles were successfully synthesized by precipitation method.
Acknowledgements This work is supported by Thailand Research Fund (TRF) and Prince of Songkla University under the contract number MRG5480072.

In this paper we use a constant current mode to fabricate ZnO rod-like structure material on the steel substrate, through XRD pattern to prove the product is ZnO, and only to find ZnO nanorods have an in situ change in the high-energy electron beam irradiation.
From it we can see there is a kind of hierarchical rod-like structure except for a large number of cone-like rods and particles.
When 2θ ranges from 20° to 70°, aside from diffraction peak of the steel (JCPDS card number 65-4899), we only find diffraction peak of wurtzite (JCPDS card number 80-75), and diffraction peak of ZnO (002) is far stronger than others, which shows ZnO cone-like rods and hierarchical structures preferentially grow along the C-axis.
In our experiment we characterize three hierarchical ZnO nanorods and they all have the same results, or it can be said that ZnO nanorods are all grow along the C-axis, which is consistent with the XRD pattern in Fig.2.
Right now it has not been reported that ZnO nanocolumns have an in situ growth in the surface of ZnO in the electron beam irradiation.

Xu et al [5] obtained ZnO hexagonal particles electrodeposited from 0.05M Zn(NO3)2 solution and ZnO platelets by addition of 0.06M KCl.
They suggested the preferential adsorption of chloride ions onto (0001) ZnO surfaces as one of the responsible mechanism for the formation of platelet-like ZnO nanocrystals.
From Fig. 2(a), (b), It indicates that the particles product is wurtzite (hexagonal) ZnO structure (JCPDS card 76-704) as KCl concentration below 0.02M.
ZnO intensity becomes slight and Zn5(OH)8Cl2·H2O (JCPDS card number 07-155) spectrum increase more and more.
The XRD patterns in Fig.2 (f), (g) indicate that the products are the mixture of Zn5(OH)8Cl2·H2O and Zn (JCPDS card 87-173) at high KCl concentration (0.8M, 3.2M respectively).

Abstract Intensive and innovative research is focused on the preparation of various nanostructured materials especially nanostructured metal oxides as applicable to number of applications.The present work mainly emphasis a single step synthesis of ZnO nanoparticles by employing surfactant free forced condensation method.
All the major peaks are corresponding to the Zn (OH)2 of orthorhombic structure and are well matching with the JCPS card 20-1437 (Fig. 1 (a)).
All the major diffraction peaks are well matching with the ZnO material corresponding to wurtzite hexagonal structure and diffraction data are in agreement with JCPDS card of ZnO (JCPDS card 05-0664).
The diameter of the ZnO particles ranges from 75 - 150nm.
Rao, Solvothermal synthesis of nanorods of ZnO, N-doped ZnO and CdO, Mater.

Peak positions and relative intensity for the naturally grown composites were compared to values from Joint Committee on Powder Diffraction Standards (JCPDS) card for ZnO (JCPDS PDF #36-1451) and for Zn (JCPDS PDF #04-0831).
XRD patterns of the ZnO conversed from metallic Zn particles in water.
SEM images of ZnO conversed from metallic Zn particles in water.
PL spectra of the ZnO conversed from metallic Zn particles in water.
Acknowledgements This work was financially supported by the grant from Changzhou University under the contraction number ZMF1002132.