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To overcome this problem, numerous experiments have been performed to fabricate superhydrophobic woods surfaces via a number of different approaches.
The XRD diffraction peaks of the hydrothermally treated wood shown in Fig. 1B are well indexed to the standard diffraction pattern of hexagonal phase ZnO (Fig. 1C; JCPDS card No. 36-1451), which suggests a wurtzite structured ZnO with high crystallinity covered onto the wood surface.
XRD patterns of: (A) the pristine wood; (B) the hydrothermally treated wood; (C) standard ZnO (JCPDS card No. 36-1451) Fig. 2a shows the SEM image of the tangential section of the pristine wood.

The bulk SbSI being a ferroelectric semiconductor shows unusually large number of interesting properties such as pyroelectric, pyrooptic, piezoelectric, electromechanical, electrooptic and other nonlinear optical effects [3,4].
Stróż, Ultrasonics Sonochemistry 16 (2009) 800 [9] Antimony Sulfide Iodide, JCPDS - International Centre for Diffracton Data 2000, PCPDFWIN vol. 2.1 Card File No. 74-0149 [10] Carbon, JCPDS - International Centre for Diffracton Data 2000, PCPDFWIN vol. 2.1 Card File No. 75-1621 a b c

The recorded XRD pattern of the nanoplates is illustrated in Fig. 3, which indicates that the nanoplates were of MoO2 phase (JCPDS card No. 65-5787).
The well-resolved periodic lattice fringes of the shell reveals that the nanoplate was of single crystalline structure, and one set of lattice fringe was clearly observed with a distance of about 0.244 nm, which is corresponding to the interplanar distance from the (-202) plane of MoO2 (JCPDS card No. 65-5787), indicating that the nanoplate was MoO2, which is consistent with XRD result.
The pattern is composed of a number of spots corresponding to (-302) and (-202) planes of the crystalline plate.

Introduction There have been an increasing number of excellent researches on the fabrication of complex hierarchical architectures or superstructures, because of the practical importance related to some fractal growth phenomena and potential applications [1-3].
It exhibits that all the diffraction peaks can be exactly assigned to the pure phase of SrSO4:Sm3+ according to JCPDS file (80-0523) in the orthorhombic system and no impurity lines are observed.
The relative intensity of the diffraction peaks is slightly different from the standard card, which may relate to the preferential growth of the microcrystal particles under the given reaction condition [9].
Fig. 1XRD patterns of as-prepared SrSO4:Sm3+, and JCPDS card No.80-0523 as a reference.

Srinagarind Hospital in Thailand treated 1,950 cleft lip and palate patients from 1984 – 2007, and patient numbers have been increasing over the past few years [1].
Results and Discussion Materials Characterization The XRD spectra of bovine bone HA were compared with JCPDS-ICDD Card no. 9 – 432 [14].
According to the comparison, all significant peaks of the synthesized powder matched JCPDS – ICDD.
No. 3090094, (1963) [14] JCPDS-ICDD Card No.9-432.

Peaks matches of gadolinium oxide with standard JCPDS card No: 01-074-1987 and 00-043-1014.
Peaks matches of cerium doped cobalt ferrite with standard JCPDS card No: 22 -1086 and JCPDS No 01-074-6403.
Peaks matches of composite with standard JCPDS card No: 00-011-608, 00-011-0604 and 00-022-1086.
When low voltage pulse is applied ReRAM device remains in high resistance state and so very less charge carrier will cross heterointerface and so there are less freely flowing electrons but when high voltage pulse is applied large number of charge carriers will goes into heterointerface.

The peaks at 37.3, 43.3, and 62.9° in both patterns can be assigned to (111), (200), and (220) reflections of cubic NiO (JCPDS card no. 47-1049).
In the pattern of NiO/Ag electrode, the peaks at 38.1 and 64.4° correspond to (111) and (220) reflections of Ag (JCPDS card no. 89-3722).
The separation between the reduction and oxidation peaks of NiO/Ag electrode decrease as compared to NiO electrode, indicating weaker polarization and better reversibility. 0 10 20 30 40 0 300 600 900 1200 NiO NiO/Ag Capacity (mAh g-1) Cycle Number Fig. 5.

The peak set found in diffraction patterns were identified identify by comparing with similar compositions of titanium dioxide phases available on JCPDS data bank [19].
In both samples, the diffraction peak sets correspondent to the anatase single phase, with tetragonal symmetry and space group I41AmdZ, according the JCPDS card number 21-1272, as van be observed by peaks at 25, 38, 48, 54, 55, 63, and 68 º(2-theta).
The raw data of X-ray diffraction were refined by Rietveld method by the structural model found on ICSD structural data bank [22] in card number 82084.
The structural parameters for reference phase available on ICSD card used as structural model are also presented in that table.
[19] JCPDS - Joint Committee on Powder Diffraction Standards/International Center for Diffraction Data, Powder Diffraction File 2003

Introduction Investigation of rare earth (RE) doped up-conversion (UC) materials has been attractive still due to a large number of potential applications such as detectors for infrared radiation, fluorescent labels for sensitive detection of biomolecules, and UC lasing [1-4].
The obtained films on PET showed intense green photoluminescence under 980 nm-laser excitation, indicating that they can be potentially used as IR detection cards.
Thus, it is expected that the phosphor-organo-silicon films are beneficial for achieving high-performance IR detection cards.
From this result, the XRD patterns are consistent with JCPDS Card No. 22-0153 (Cell parameters: a = 0.544 nm, b = 0.7643 nm, and c = 0.5381 nm).
Fig. 3(b) shows photograph of the IR detection card that was prepared by screen printing the paste containing the phosphor powder and the organo-silicon compound onto PET.

The diffraction peaks are due to the JCPDs card, which means that LaP04 are formed.
As shown in Fig. 1 we can find that compared with the JCPDS standard card that all peaks coincide with the peaks shown in the PDF number: 32-0493, it is simple phase of LaPO4 and orthorhombic, the space group is P21 / n.