Search results

The detected peaks of the HA XRD result match with the hydroxyapatite phase according to JCPDS card No. 96-900-1234.
The detected peaks of the TiO2 XRD pattern consistent with the anatase phase and JCPDS card No. 96-900-9087 (Fig. 1b).
Figure 4: (a) SEM cross-section of FGC TiO2-HA and (b) FESEM cross-section of HA layer along with (c) EDS spectrum of point number 1 Figure 5 showing lateral force (FL) vs. normal force (FN) curves along with scratch tracks AFM images of three types of studied samples.

The electrons in graphene obey a linear dispersion relation and behave like massless relativistic particles[3], resulting in the observation of a number of very peculiar electronic properties such as the quantum Hall effect, ambipolar electric field effect, good optical transparency, and transport via relativistic Dirac fermions[4].
Pure BiOCl is all in good accordance tetragonal structure with the standard card (JCPDS 10–0445).
However，in our work only tetragonal BiOCl (JCPDS 10-0445) were observed in the BiOCl/GS composite photocatalysts without GS peak (Fig. 3b,c).

This process was repeated to obtain the required number of layers.
The vertical lines show the ZnS powder diffraction pattern from the Joint Committee on Powder Diffraction Standards (JCPDS) Card No. 05-0566.
In the nanocomposites, various diffraction peaks were observed, which were, according to JCPDS file No. 05-0566 (shown as vertical lines in Fig. 4), assigned to the (111), (220) and (311) planes of the cubic phase of zinc blende ZnS.

In Fig. 3a, four diffraction peak can be indexed to the Cu face-center cubic structure (JCPDS, 4-386), also confirming the successful deposition of copper.
From Fig. 3b, five reflection peaks attributed to (111), (200), (220), (311), (222) planes respectively can be perfectly indexed to the Ag face-centered cubic crystal structures compared with the standard JCPDS cards (4-783).
Acknowledgements This work was financially supported by the National Natural Science Foundation of China (NSFC) under the grant number of 10975138.

In a number of researches it was established that at high-temperature annealing of composite, consist of nanocrystalline nickel nanowires (NC NWs) electrodeposited into porous anodic alumina oxide (PAA), the radial pressure which oxide render on NWs, because of distinction of matrix and NC nickel TCLW, can be softened with their axial expansion, if NWs are single-crystal [2].
Shaped lines designated positions of diffraction lines of reference powder Ni of the database of the International Center for diffraction data (JCPDS).
Comparison of diffraction lines intensity (I) with a card for powdery Ni (shaped lines) allowed estimating crystal structure of a sample.
Values from the JCPDS are given in brackets of column 2θ.

This is because large numbers of hydroxyl groups exist on the wet particle surface.
X-ray diffraction peaks of ZnO nanoparticles agreed with the reported JCPDS data (JCPDS Card No. 36-1451) and compared this results with data published in many articles.

JCPDS card no. 01-075-1526 and 01-088-0618 was used as reference to identify ZnO and Zn3N2 phases respectively.
(1) where I(hkl) is the relative intensity of the plane (hkl), Io(hkl) is the standard relative intensity of particular plane (hkl) from the reference ZnO data and n is the number of plane(hkl) have been measured.
Sample (hkl) plane TC(hkl) FWHM (2θ) a (Ǻ) c (Ǻ) c/a (Ǻ) stress in film, σ (Gpa) JCPDS 01-075-1526 - - - 3.220 5.200 1.615 - A (100) 0.947 - - - - -   (002) 1.053 0.577 3.257 5.130 1.575 3.410 B (100) 0.755 - - - - -   (002) 1.498 0.271 3.213 5.139 1.599 3.000   (101) 0.748 - -  -  - -  C (100) 0.543 - - - - -   (002) 1.851 0.214 3.216 5.143 1.599 2.830   (101) 0.605 - - - - - Electrical properties Fig. 4 shows the IV characteristics of the sample B and sample C.

Results and discussion The powder analysis by X-ray diffraction (XRD) (Fig. 1) shows the perovskite single structure phase formation according the JCPDS data bank.
This diffraction profile can be adjusted to the Rhombohedral (R3mR - card number #77585) and tetragonal (P4mm - card number #90699) structures, according the ICSD structure data bank.

The peak positions correspond with the peak positions listed on JCPDS card no. 04-0836 for copper.
To get a good profile fit of an x-ray peak, the number of data points above the FWHM should be at least 5 to 7 points [7-9].
For an x-ray peak, the number of data points above FWHM is (5) From Table 4, only 0.03o step size has the number of data points that begins to develop good models.
(hkl) R2 P-Value m c 1 (111) -0.0002 ± 0.0006 0.1554 ± 0.0013 0.0366 0.48 2 (200) -0.0017 ± 0.0018 0.1948 ± 0.0038 0.2224 0.07 3 (220) -0.0005 ± 0.0012 0.1801 ± 0.0025 0.0481 0.41 Table 4 The number of data points above FWHM of each diffracting peak No.
(hkl) FWHM Number of Data Points Step Size [deg] 0.03 0.05 1 (111) 0.1554 5 3 2 (200) 0.1948 6 3 3 (220) 0.1801 6 3 Summary The relative error in integrated intensity calculation can be minimized only by increasing the preset time and it should be greater than one second.

All the diffraction peaks of the Graphene-ZnWO4 can be exactly indexed as a monoclinic wolframite tungstate structure according to the standard card (JCPDS Card number: 73-0554).
Therefore, the significant enhancement of photocatalytic activity can be attributed to a more efficient separation for electron-hole pairs, resulting in the increase of number of holes and O2·- participated in the photooxidation process.