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Online since: March 2017
Authors: Mohamed Wahab Mohamed Hisham, Alinda Samsuri, Mohd Ambar Yarmo, Mohd Nor Latif
The results reveal, MoO3 were start reduced to MoO2 phase (JCPDS card no. 76-1807) after non-isothermal reduction until 700 °C.
However, intermediate phase of Mo4O11 peaks (JCPDS card no. 05-0337) were also observed that shows reduction until 700 °C is not enough to completely reduce MoO3 to MoO2 phase.
Few peaks of Mo (JCPDS card no. 65-7442) were also detected that indicate reductions to metallic Mo were started.
Acknowledgement The authors wish to thank the Ministry of Higher Education (MOHE) and Universiti Kebangsaan Malaysia (UKM) for funding this project under research grant number BKBP-FST-K003323-2014, FRGS/2/2013/TK06/UKM/02/3, ETP-2013-066, TD-2014-024, as well as Centre of Research and Innovation Management (CRIM) for the instruments and facilities.
However, intermediate phase of Mo4O11 peaks (JCPDS card no. 05-0337) were also observed that shows reduction until 700 °C is not enough to completely reduce MoO3 to MoO2 phase.
Few peaks of Mo (JCPDS card no. 65-7442) were also detected that indicate reductions to metallic Mo were started.
Acknowledgement The authors wish to thank the Ministry of Higher Education (MOHE) and Universiti Kebangsaan Malaysia (UKM) for funding this project under research grant number BKBP-FST-K003323-2014, FRGS/2/2013/TK06/UKM/02/3, ETP-2013-066, TD-2014-024, as well as Centre of Research and Innovation Management (CRIM) for the instruments and facilities.
Online since: November 2015
Authors: Pavel Anatolyevich Podrabinnik, Igor Vladimirovich Shishkovsky
Their phase composition was determined using JCPDS PDF data (PCPDFWIN ver. 2.02, release 1999) and the Crystallographica SearchMatch ver. 3.102 program.
Figure 3: Analysis of laser annealed coating: a) – SEM analysis; b) – EDS analysis of a dendrite area; c) – Ni distribution; d) – Al distribution Qualitative phase analysis after LaCS process is presented in Fig. 4.The intensive lines of initial Al alloy (Al3.21Si0.47 phase, JCPDS card no. 41-1222) and free Al (JCPDS card no. 01-1180) are observed.
Moreover, Al3Ni2 phase was found (JCPDS, card no. 14-0648) which indicates intermetallic synthesis in the Ni–Al system.
Meanwhile it is well known that numbers of intensity lines for Al3Ni2 and NiAl phases coincide on XRD patterns, therefore for a single-valued assertion about the presence of these phases thorough quantitative phase analysis is required.
Figure 3: Analysis of laser annealed coating: a) – SEM analysis; b) – EDS analysis of a dendrite area; c) – Ni distribution; d) – Al distribution Qualitative phase analysis after LaCS process is presented in Fig. 4.The intensive lines of initial Al alloy (Al3.21Si0.47 phase, JCPDS card no. 41-1222) and free Al (JCPDS card no. 01-1180) are observed.
Moreover, Al3Ni2 phase was found (JCPDS, card no. 14-0648) which indicates intermetallic synthesis in the Ni–Al system.
Meanwhile it is well known that numbers of intensity lines for Al3Ni2 and NiAl phases coincide on XRD patterns, therefore for a single-valued assertion about the presence of these phases thorough quantitative phase analysis is required.
Online since: March 2013
Authors: Chinna Kannaiyan Senthil Kumaran, Natarajan Muthukumarasamy, Mariyappan Thambidurai, Ponnaian Peula Kumari, Rachel Oommen Rachel Oommen, Santhanam Agilan
The diffraction peak at 2θ (degrees) value of 43.63° is indexed as the (400) plane of Fe and corresponds to the body centered cubic structure of Fe with lattice constant a = 2.847Å, and this is in good agreement with those on the standard card (JCPDS card No. 89-0721).
All the diffraction peaks in the 2θ range measured corresponds to the cubic structure of Fe2 O3 with lattice constant a = 8.342Å, and this is in good agreement with those on the standard card (JCPDS card No. 89-5892).
Using the particle number and particle diameter of the particle in the TEM image the particle size has been calculated.
All the diffraction peaks in the 2θ range measured corresponds to the cubic structure of Fe2 O3 with lattice constant a = 8.342Å, and this is in good agreement with those on the standard card (JCPDS card No. 89-5892).
Using the particle number and particle diameter of the particle in the TEM image the particle size has been calculated.
Online since: January 2011
Authors: Cheng Mu, Jun Hui He
A number of methods, such as the solution-based sol-gel process [4], precipitation method [5, 6], hydrothermal method [7-11], electrospinning method [12, 13], template method [14-17], and solid–liquid chemical route [18] have been used to synthesize rare-earth compound nanowires, nanobelts and nanotubes.
All the peaks in Fig. 1A can be readily indexed to the monoclinic structure LaPO4 (cell constants a= 6.8 Å, b=7.0 Å, c= 6.4 Å; JCPDS Card No. 84-0600).
Similarly, diffraction peaks in Fig. 1B can be ascribed to a pure monoclinic phase of NdPO4 (cell constants a= 6.7 Å, b=6.9 Å, c= 6.3 Å; JCPDS Card No. 78-1167).
By analogy, diffraction peaks in Fig. 1C can be confirmed to fit a monoclinic structured of PrPO4 (cell constants a= 6.7 Å, b=6.9 Å, c= 6.4 Å; JCPDS Card No. 78-1025).
Finally, all the peaks in Figure 1D can be assigned to tetragonal dehydrated YPO4 (cell constants a= 6.8 Å, c= 6.0 Å; JCPDS File No. 84-0335).
All the peaks in Fig. 1A can be readily indexed to the monoclinic structure LaPO4 (cell constants a= 6.8 Å, b=7.0 Å, c= 6.4 Å; JCPDS Card No. 84-0600).
Similarly, diffraction peaks in Fig. 1B can be ascribed to a pure monoclinic phase of NdPO4 (cell constants a= 6.7 Å, b=6.9 Å, c= 6.3 Å; JCPDS Card No. 78-1167).
By analogy, diffraction peaks in Fig. 1C can be confirmed to fit a monoclinic structured of PrPO4 (cell constants a= 6.7 Å, b=6.9 Å, c= 6.4 Å; JCPDS Card No. 78-1025).
Finally, all the peaks in Figure 1D can be assigned to tetragonal dehydrated YPO4 (cell constants a= 6.8 Å, c= 6.0 Å; JCPDS File No. 84-0335).
Online since: January 2014
Authors: Ji Qi, Guan Gran Sun, Chen Niu, Bin Zhao, Naisen Yu
The XRD pattern of the precursor (a) and standard PDF card data (b) were shown as Fig. 1.
By comparing the results with V2O5 standard JCPDS card (PDF ID number 41-1426) of XRD data documents, there were no impurity peaks to be found in the diffraction pattern.
The XRD pattern of the products and standard PDF card data were shown as Fig. 2.
By comparing the results with standard JCPDS card (PDF ID number 43-1051) of XRD data documents, the product sample was a match to monoclinic phase group C2/m with lattice constants a = 5.743Å , b = 4.517Å, and c = 5.375Å.
By comparing the results with V2O5 standard JCPDS card (PDF ID number 41-1426) of XRD data documents, there were no impurity peaks to be found in the diffraction pattern.
The XRD pattern of the products and standard PDF card data were shown as Fig. 2.
By comparing the results with standard JCPDS card (PDF ID number 43-1051) of XRD data documents, the product sample was a match to monoclinic phase group C2/m with lattice constants a = 5.743Å , b = 4.517Å, and c = 5.375Å.
Online since: August 2018
Authors: Adil Bouregba, Adeljebbar Diouri
The corresponding reflections have been indexed using the Diffraction Data (ICDD)-Card.
The polymorphic from obtained C3P was ß-C3P according to JCPDS card No. 01-072-7587.
Moreover ICDD)-Card No. 01-070-0388 (JCPDS) that are assigned to the ß-C2S phase with small peaks of Wollastonite-2M, according to JCPDS card No. 00-027-0088.
All the observed diffraction peaks can be assigned to the characteristic reflections of Ca5SiO2(PO4)2 according to the JCPDS card No. 00-040-0393.
During the advancing of dissolution and precipitation process, the size and number of the aggregates grew, as an outcome, the precipitated layer became denser and uniform covering the entire surface.
The polymorphic from obtained C3P was ß-C3P according to JCPDS card No. 01-072-7587.
Moreover ICDD)-Card No. 01-070-0388 (JCPDS) that are assigned to the ß-C2S phase with small peaks of Wollastonite-2M, according to JCPDS card No. 00-027-0088.
All the observed diffraction peaks can be assigned to the characteristic reflections of Ca5SiO2(PO4)2 according to the JCPDS card No. 00-040-0393.
During the advancing of dissolution and precipitation process, the size and number of the aggregates grew, as an outcome, the precipitated layer became denser and uniform covering the entire surface.
Online since: August 2010
Authors: Xiao Ping Zou, Jin Cheng, Gang Qiang Yang, Xue Ming Lü, Cui Liu Wei, Zhe Sun, Hong Ying Feng, Yuan Yang, Xiang Min Meng, Gong Qing Teng
The
corresponding XRD pattern (in Figure 2 (a)) exhibits the plate film is a mixture of ZnO (JCPDS card
number 76-704) and Zn5(OH)8Cl2•H2O (JCPDS card number 07-155).
However, after heat treatment at 500°C for 5h, the sample totally changed to ZnO (JCPDS card number 76-704).
However, after heat treatment at 500°C for 5h, the sample totally changed to ZnO (JCPDS card number 76-704).
Online since: January 2014
Authors: Yi Ren Lu, T. Ling, X.W. Du, P.F. Yin, H. Zhang, X.Y. Chen
A number of methods have been explored to synthesize and characterize 1D CdS nanostructures in the past decades,and a host of CdS-based nanostructures such as nanowires (NWs),nanoribbons (NRs)/nanobelts, and nanotubes (NTs), etc. have been successfully achieved[3,8].
Fig 2 shows a typical XRD pattern of the product deposited on the FTO substrate, which indicates that sample is mainly composed of cubic zinc blende-structured CdS (JCPDS Card, No.41-1049) and small amounts of orthorhombic structure Bi2S3 (JCPDS,17-0320).
Three peaks due to other phases, such as CdO (JCPDS Card, No. 05-0640), were detected, indicating the impurity of the products.
As shown in Figure 2, new peaks emerge in addition to Cd, S and FTO substrate, which can be indexed as cubic zinc blende-structured CdS (JCPDS Card, No.21-0829) Figure4 (a,b) TEM image of an individual CdS uniform branchedNanowire and Bi particle on its tip, implying a VLS growth mechanism.
Fig 2 shows a typical XRD pattern of the product deposited on the FTO substrate, which indicates that sample is mainly composed of cubic zinc blende-structured CdS (JCPDS Card, No.41-1049) and small amounts of orthorhombic structure Bi2S3 (JCPDS,17-0320).
Three peaks due to other phases, such as CdO (JCPDS Card, No. 05-0640), were detected, indicating the impurity of the products.
As shown in Figure 2, new peaks emerge in addition to Cd, S and FTO substrate, which can be indexed as cubic zinc blende-structured CdS (JCPDS Card, No.21-0829) Figure4 (a,b) TEM image of an individual CdS uniform branchedNanowire and Bi particle on its tip, implying a VLS growth mechanism.
Online since: November 2017
Authors: Besim Ben-Nissan, Sophie Cazalbou, Louise Evans, Sutinee Sinutok, Gina Choi, Ipek Karacan
Calcium phosphate materials can be produced using a number of wet methods that are based on hydrothermal or co-precipitation methods that might use acidic or basic chemical environments.
Although the major phase of unconverted Hc calcified and hard coral samples refers to aragonite material (JCPDS card No. 00-003-1067) which is a high-pressure stable phase of calcium carbonate (CaCO3), uncleaned-unconverted Hc calcified algae contained one minor phase which was identified as NaCl.
Additionally, clean-unconverted Hc calcified algae and hard coral samples which were dried at 350C° before conversion show some calcite ((JCPDS card No. 01-072-1650) peaks.
Diffraction patterns of Hc calcified algae and hard coral show that the inorganic component of the marine samples have been converted to HAp (JCPDS card No. 00-009-0432) successfully.
Although the major phase of unconverted Hc calcified and hard coral samples refers to aragonite material (JCPDS card No. 00-003-1067) which is a high-pressure stable phase of calcium carbonate (CaCO3), uncleaned-unconverted Hc calcified algae contained one minor phase which was identified as NaCl.
Additionally, clean-unconverted Hc calcified algae and hard coral samples which were dried at 350C° before conversion show some calcite ((JCPDS card No. 01-072-1650) peaks.
Diffraction patterns of Hc calcified algae and hard coral show that the inorganic component of the marine samples have been converted to HAp (JCPDS card No. 00-009-0432) successfully.
Online since: March 2018
Authors: Chien Chon Chen, Zue Chin Chang, J.Y. Ling
The ratio between the calculated d values is calculated by the formula Rd = λL and JCPDS [14] that the crystal plane are (111), (200) and (220), respectively, as shown in Fig. 5c.
The XRD patterns of the nano- nickel wire without heat treatment were compared with the 2θ values of the location of the diffraction peak by JCPDS card [14], and the diffraction peaks were (111), (200 ), and (220), consistent with the crystal structure obtained from the TEM selective diffraction.
Using the JCPDS card [15,16] to compare the diffraction peak analysis, it is found that the diffraction peak of NiO (111) appears at 300 ℃ and the addition of NiO (200) and NiO (220) at 500 ℃.
The XRD patterns were compared with those without oxidation The XRD pattern of the nickel wire is combined and analyzed with the JCPDS card [15,16], as shown in Figure 7.
According to Fajan`s Rules [19], the relationship between ion charge number and ion radius, Ni2 + and Ni3 ion radius (respectively: Ni2 + = 69 pm, Ni3 + = 70 pm) is not much difference, but because of its charge, so that the atomic spacing due to the impact of electronic repulsion generated unit lattice volume difference.
The XRD patterns of the nano- nickel wire without heat treatment were compared with the 2θ values of the location of the diffraction peak by JCPDS card [14], and the diffraction peaks were (111), (200 ), and (220), consistent with the crystal structure obtained from the TEM selective diffraction.
Using the JCPDS card [15,16] to compare the diffraction peak analysis, it is found that the diffraction peak of NiO (111) appears at 300 ℃ and the addition of NiO (200) and NiO (220) at 500 ℃.
The XRD patterns were compared with those without oxidation The XRD pattern of the nickel wire is combined and analyzed with the JCPDS card [15,16], as shown in Figure 7.
According to Fajan`s Rules [19], the relationship between ion charge number and ion radius, Ni2 + and Ni3 ion radius (respectively: Ni2 + = 69 pm, Ni3 + = 70 pm) is not much difference, but because of its charge, so that the atomic spacing due to the impact of electronic repulsion generated unit lattice volume difference.