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Online since: March 2015
Authors: D. Devika, Suneel Kumar Chaudhary, Soumya Shekhar Dass
The obtained diffraction pattern was compared using standard JCPDS data with Pcpdfwin software.
Rockwell Hardness number was determined by the difference in depth of penetration resulting from application of initial minor load of 0.1 KN followed by major load of 1.5 KN.
The obtained diffraction pattern was compared with reference spectra in JCPDS database using Pcpdfwin software and has matched with JCPDS card no.656231.
It was observed that for a field area of 832927.2 µm2, total number of counts for EBM Ti-6Al-4V sample was 10371 while for wrought sample it was 3163 and both had the median grain sizes in the range 13-15 µm as shown in Fig. 8.
Online since: September 2013
Authors: S. Rajesh, Francis P. Xavier, T. Ganesh
The peaks corresponding to the reflections from the GIXRD study are in good agreement with the JCPDS data (Card No.79-0208).
The bond length [33] calculated from the lattice parameter are in good agreement with JCPDS data.
It is found that the packing density is more in the case of aluminium doped zinc oxide for Al 1-1.5 % and less number of grain boundaries.
Al (%) Cell parameters a=b c (Å) (Å) Cell volume (Å)3 Bond length (Å) i002 Cryst size from XRD (nm) Grain Size from FESEM (nm) Dislocation density (x 1015 ) lines/m2 Micro strain x 10-3 c-axis strain (%) 0 % 3.266 5.228 48.33 1.987 0.60 24 30 1.73 6 0.42 1 % 3.244 5.190 47.32 1.974 0.56 20 25 2.50 2.7 - 0.29 1.5 % 3.243 5.192 47.30 1.973 0.59 19 23 2.77 4.5 - 0.26 2 % 3.249 5.201 47.50 1.976 0.42 17 21 3.46 3 - 0.09 4 % 3.236 5.216 47.39 1.973 0.41 15 19 4.44 1.4 0.19 5 % 3.261 5.222 48.29 1.989 0.48 14 16 5.10 0.7 0.50 JCPDS 79-0208 3.264 5.219 48.18 1.985 0.21 - - - - - Optical studies The optical absorbance and transmittance were investigated for ZnO and aluminium doped ZnO thin films of various concentrations in the UV to Visible range.
Online since: June 2022
Authors: Muhammad Nur Ikhsanudin, Meidiana Arinawati, Nursukatmo Hartoto, Hanida Nilasary, Haryo Satriya Oktaviano, Soraya Ulfa Muzayanha, Anif Jamaluddin
The results presented in a graphic pattern show an association between all CuC2O4.xH2O diffractions and the Moolooite crystal structure (0 JCPDS 21-0297).
In addition, the CuO samples also demonstrated a monoclinic crystal structure (JCPDS No.00–045-0937) [24] with lattice constants shown in Table 2 and further indicates high crystallinity by sharp peaks.
In addition, the graphite material diffraction pattern was included as a comparison and was characterized by significant crystal peaks observed by a reference database (JCPDS card, No. 41-1487).
Pertamina with contract number 007/P00000/2019-S0.
Online since: November 2016
Authors: Egle Conforto, Stephane Cohendoz, Cyril Berziou, Xavier Feaugas, Patrick Girault
The temperature associated with these two processes slightly increase as a function of the cycle number, as a result of the homogenizing hydrogen distribution in the alloy bulk.
Peaks were identified by comparison with those in the JCPDS database (cards: 01-078-2921, 00-034-0649, 00-036-1340 and 00-036-1339).
Fig. 5 shows the evolution of Td (Fig. 5a) and Tp (Fig. 5b) as a function of the number of cycles for Zy-4 containing 112 wppm and 356 ppm of H.
Dissolution Precipitation Fig. 5: Evolution of Td and Tp as a function of the number of cycles for Zy-4 samples containing 112 ppm and 356 ppm of H.
Also, Td and Tp values, and probably the difference between their evolution curves vary as a function of the cycle number.
Online since: November 2010
Authors: Zhen Xing Liu, Hai Yan Du, Jia Yue Sun
All of the peaks can be indexed to the SrS phase (JCPDS No. 75-0895), which were in good agreement with the standard values for the SrS.
XRD patterns for SrS: Eu2+, RE3+ composites and the JCPDS card 75-0895 for SrS is also given.Synthesis and molecular structure of the UV-curable sealant.
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Online since: September 2023
Authors: Bouzid Boudjema, Regis Barille, Daira Radouane, Dhikra Bouras, Zerouali Madiha
A number of procedures and techniques including membrane filtration, adsorption, coagulation or flocculation, electrochemical oxidation processes and biodegradation have been documented [7].
The existence of the Ag2O phase given by the four diffraction peaks found at the values 2θ =27.77°,38.26°,54.68°, and 64.55° correspond to the planes (110), (200), (211), (311) respectively and agree well with the JCPDS file (code00-041-1104).The peak (440) is in agreement with the JCPDS card (code00-040-0909) indicating the formation of silver oxide Ag2O3.
Moreover, the presence of large pores and in greater number with an increase in the doping rate confirms that Ag gives a more porous surface.
It was also observed that there was an increase in the number and in the average size of pores.
Pore number increases with the increase of the doping rate, which gave a very high efficiency and more catalytic surfaces.
Online since: January 2026
Authors: Wei Sha, Jothi Sudagar, Megha Unni, Seethiraju D. Ramarao, M. Muneeswaran, P. Nageena
The integration of Co-W-Zr into the Ni(P) matrix notably enhances the number of active sites during the hydrogen evolution reaction.
The diffraction peaks around 2θ = 45.12° and 82.69° match those of FCC Ni according to JCPDS card number 1534892, confirming phase purity.
Acknowledgements The authors acknowledge the VIT-AP University for the THERMEC conference support, and also acknowledge the financial support received from the RGEMS project number: VIT-AP/SpoRIC/RGEMS/2023-24/010.
Online since: May 2012
Authors: S. Salam, S. Ameer, M. Islam, M. Ikram, Ashari Maqsood
Fig 2 shows the mass percent and the visual grain size of films as a function of the number of coating cycles.
All the XRD peaks were identified with the standard card JCPDS 36-1451in the recorded range of 2θ.
Fig 4 indicates that the transmittance of ZnO films gradually decreased as the number of coating cycles increased.
Higher values of magneto-resistance for different thicknesses have been found in ZnO thin films. a,b and c are for different number of layers as "a" is for 3 layers i.e. 860 nm thickness, "b" is for 5 layers i.e. 1160 nm thickness and "c" is for 10 number of layers i.e. 1510 nm thickness.
As Grain size increases with the thickness which results in lower resistivity due to higher number of carrier concentration present.
Online since: November 2019
Authors: S. Ghanaraja, K.S. Ravikumar, R. Madhu, P. Likith
Metal matrix composites reinforced by nano particles are very promising materials, suitable for a large number of applications.
A number of secondary processes can be applied to the composites usually with objectives of consolidation and improving the particles distribution.
Fig. 1: SEM micrographs showing size and particle shape of the nano alumina powder Fig. 2: EDAX Spectrum of nano Al2O3 particles used in the synthesis of Al 1100 (Mg) - nano Al2O3 composites Fig. 3: XRD pattern of nano Al2O3particles used in the synthesis of Al 1100 (Mg) nano Al2O3 composites Fig. 4: Average Brinell hardness of forged unreinforced alloy and nanocomposites developed by increasing the wt% of nano Al2O3 particles The powder has been examined for their X-ray diffraction (XRD) pattern as shown in Fig 3, using X-ray diffractometer in the 2θ range of 10-70° using CuKa radiation target and nickel filter, step size and dwell time were suitably adjusted, which was used for identification of various phases with the help of inorganic JCPDS (Joint Committee on Powder Diffraction Standards) X-ray diffraction data card available from the International Centre for Diffraction Data as the Powder Diffraction File (PDF).
The fall in strength and ductility at beyond 0.5 wt% addition of Al2O3 powders has been attributed to moderate increase in porosity, which in forged composite, enhances due to limited ability of the matrix alloy to flow due to restraints imposed by large number of nano-particles leading to increased remaining porosity as well as increased nucleation of voids. 5.
Online since: October 2023
Authors: M. Jothibas, T. Meganathan, P. Arivazhagan, P. Arunkumar, B. Arunkumar
The reported diffraction spectra of Pristine ZrO2 thin film were adequately indexed with the common JCPDS card No: 79-1771 with tetragonal crystalline system.
Secondly, Fig.2b demonstrates the XRD patterns of 10at.% of In-doped ZrO2 thin film, which is exhibits the arrival of new peaks on the spectra at 21.19o, 30.52o, and 45.29o with a relative (2 1 1), (2 2 2) and (1 3 4) planes indexed with Indium JCPDS Card: 06-0416, respectively.
The thin films' sharp absorption edge has a restricted grain size distribution and a decreased number of defects.
Fig. 10(a,b) HR-TEM and (c,d) SAED patterns, and (e,f) EDAX spectra Pristine and 10 at.% In-doped ZrO2 thin films Moreover, we attached a histogram plot for the particle size (nm) with respect to the number of counts for all of the of thin films, the Pristine ZrO2 have a greater number of particles were populated at 22nm with 7.41 of standard deviation.
As seen from Fig.11a,bthe histogram plot of In-doped ZrO2 signifies a 19nm ranging average number of particles with a 7.99 standard deviation.