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Online since: August 2019
Authors: Johannes Z. Mbese, Peter A. Ajibade, Funeka Matebese, Mojeed A. Agoro
SEM images show the surface morphology of CuS nanocrystals and the image resolution of this kind microscopy is limited to approximately 1 µm (10-6 m) as oppose to TEM with limits of 1 Å (10-10 m).
Fig. 1.
References [1] S.K.
Wu, In Handbook of Nanoparticles 2015, pp. 1-28.
Acta 85 (2012) 479-483
Fig. 1.
References [1] S.K.
Wu, In Handbook of Nanoparticles 2015, pp. 1-28.
Acta 85 (2012) 479-483
Online since: February 2014
Authors: Kaneko Kensei, Furutani Katsushi
Table 1 shows the machining conditions.
Each observed plane corresponds to the coordinate system of the workpiece shown in Fig. 1.
In case of positive electrode polarity, the component ratio of Ti was approximately 1-3 at.%.
References [1] H.
Bartolome: Mullite-refractory metal (Mo, Nb) Composites, Journal of the European Ceramic Society, Vol. 28 (2008), pp. 479-491 [6] K.
Each observed plane corresponds to the coordinate system of the workpiece shown in Fig. 1.
In case of positive electrode polarity, the component ratio of Ti was approximately 1-3 at.%.
References [1] H.
Bartolome: Mullite-refractory metal (Mo, Nb) Composites, Journal of the European Ceramic Society, Vol. 28 (2008), pp. 479-491 [6] K.
Online since: December 2012
Authors: Yu Ying Zhou
In the simulations, two channel environments are investigated with the delay profiles shown in Table 1 and Table 2.
References [1] Y.
Commun., vol. 49, no. 3, pp. 467–479, Mar. 2001
Wireless Commun., vol. 3, no. 1, pp. 315–325, Jan. 2004
Signal Process., vol. 42, no. 1, pp. 102–112, Jan. 1994.
References [1] Y.
Commun., vol. 49, no. 3, pp. 467–479, Mar. 2001
Wireless Commun., vol. 3, no. 1, pp. 315–325, Jan. 2004
Signal Process., vol. 42, no. 1, pp. 102–112, Jan. 1994.
Online since: November 2012
Authors: Ti Feng Jiao, Jing Xin Zhou
The molecular structures and their abbreviations were shown in Fig. 1.
Fig. 1.
When the film was transferred from Cu(Ac)2 subphase, the corresponding peaks shifted to 1605, 1381 and 1278 cm-1, respectively.
References [1] A.
Liu: Thin Solid Films Vol. 479 (2005), p. 269
Fig. 1.
When the film was transferred from Cu(Ac)2 subphase, the corresponding peaks shifted to 1605, 1381 and 1278 cm-1, respectively.
References [1] A.
Liu: Thin Solid Films Vol. 479 (2005), p. 269
Online since: February 2012
Authors: Ai Qin Lin, Min Li Zheng
The use of regression analysis [1]~[2], neural networks [3]~[5] and other methods to establish the surface roughness prediction model.
The optimization results is shown in table 1.
Acknowledgements:outstanding youth fund in Heilong jiang Province 3028-900866 Reference [1] X.Wang,C.X.
Journal of Materials Processing Technology, 1996, 56(1-4):54-56
Chinese Journal of Mechanical Engineering, 2005, 16(6): 475-479 [6]F.XU,M.L.ZHENG, B.JIANG.
The optimization results is shown in table 1.
Acknowledgements:outstanding youth fund in Heilong jiang Province 3028-900866 Reference [1] X.Wang,C.X.
Journal of Materials Processing Technology, 1996, 56(1-4):54-56
Chinese Journal of Mechanical Engineering, 2005, 16(6): 475-479 [6]F.XU,M.L.ZHENG, B.JIANG.
Online since: March 2015
Authors: Mohd Firdaus Abdullah, Samsul Setumin, Norngainy Mohd Tawil, Fatin Najwa Mohd Nusa, Sheikh Mohd Firdaus, Adi Irfan Che Ani
Methodology
Figure 1 shows the block diagram of the development microcontroller based potentiometric transduction.
Fig. 1, Block diagram of the microcontroller based potentiometric transduction circuit.
Table 1, Features of the eTape sensor at sensor and transduction stage.
References [1] A.
A CMOS Potentiostat for Amperometric Chemical Sensors, IEEE Journal of Solid-State Circuits, sc-22 473-479, 1987.
Fig. 1, Block diagram of the microcontroller based potentiometric transduction circuit.
Table 1, Features of the eTape sensor at sensor and transduction stage.
References [1] A.
A CMOS Potentiostat for Amperometric Chemical Sensors, IEEE Journal of Solid-State Circuits, sc-22 473-479, 1987.