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Materials and Methods Preparation of the KSr2Nb5O15: KSr2Nb5O15 nanometric powders (JCPDS card number 34-0108) are prepared using a Modified Polyol Method [[] R.J.

These structural materials have low density, high specific surface features, and their hollow parts have the capacity to accommodate a large number of guest molecules or large size guest molecule.
Except the existence of the peaks of aluminum hydroxide sulfate, the peaks in 28.14, 38.62, 49.3 is in coincide to orthorhombic g-AlOOH (JCPDS card no. 21-1307) and indicating that after 12h hydrothermal treatment, the product is two-phase mixture.

The diffractograms that were obtained demonstrate that all the samples can be perfectly indexed to the cubic structure (JCPDS card No. 22-1189) of crystalline NiO and there is no impurity in the powder, which proves that only NiO exists.
Those numbers are easy to communicate being consistent with a cubic structure.

In addition, a large number of borate compounds are transparent over a wide spectral range, beginning from ultraviolet (UV) and extending into visible.
All the diffraction peaks correspond to YBO3 phase and are well matched with the standard JCPDS card no. 16-277.

Within the microstructure a large number of band-type defects with irregular interval are seen in one orientation corresponding to the one {111}-type plane contained in the [110] zone axis.
The values of inter-planar spacing(d), intensity and crystallographic plane data of Co and Co7Mo6 taken from the JCPDS cards, and the measured inter-planar spacing based on experimental result(dc).

The 0.1 ml sample of the treated solution was taken and spread onto a Nutrient Agar (NA) plate, each plate was incubated at 37ºC for 24 h, and the number of viable E. coli colonies were counted.
The 0.3 and 0.5 at% ZnO doped pigments exhibited monoclinic phase at 2q (degree) of 27.9, 33 and 36.2° while the 0.1 at% ZnO displayed an amorphous phase (JCPDS Card No. 82-0661, monoclinic, P21/C 14).

Introduction There are large numbers of wide band metal oxide such as TiO2, ZnO, SnO2, ZrO2 and NiO which are potentially used in wide range of applications [1].
XRD spectrum well matches with the standard JCPDS card no 3614516.

The detectable (110), (101), (200), (211), (310) and (301) peaks from the patterns of these thin films can be assigned to those of a pure SnO2 tetragonal structure (JCPDS Card No: 46-1088, space group P42/mnm) has been confirmed from matching of observed and standard d (inter planer spacing) values.
The average lattice parameters a = 4.74 Å and c = 3.19 Å are in good agreement with the Joint Committee on Powder Diffraction Standards (JCPDS) 46-1088 database.
t=Mλ1λ22(λ1n2-λ2n1) (6) where M is the number of oxillations between the two extrema (M=1 between the two consecutive maxima or minima), λ1, n1 and λ2, n2 are the corresponding wavelengths and indices of refraction.

Introduction Researchers have seen a significant increase in the number of publications on nanotechnology over the last decade, and the area has piqued the interest of scientists in a wide range of domains including electronics, optics, aerospace, materials science, and pharmaceuticals [1].
JCPDS card data: 49-1302 is consistent with the diffraction patterns observed [18].

From the XRD data, it can be seen that all samples are polycrystalline with the hexagonal wurtzite structure [4] (P63mc space group, JCPDS card no:36-1451).
It may be observed that there are three orientations identified as (100),(002) and (101) planes at diffraction angles 31.79◦, 34.48◦, 36.30◦ for the samples with molarities from 0.025M to 0.075M.The number of peaks increases for 0.1M concentration.