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Online since: April 2018
Authors: Suphaporn Daothong
By using the difference novel 1D metal oxide nanostructures, including SnO2 [15], ZnO [16], TiO2 and etc.
Figure 3 Diameter of Nanowires on the difference mesh number.
The XRD pattern of nanowires on the mesh number 60 was shown in Figure 4.
It was found that the diffraction peaks related with crystalline phase of a-Fe2O3 (JCPDS card number79-0007), and Cr3O (JCPDS card number 72-5028) from substrate, respectively.
Choopun, Sparking deposited ZnO nanoparticles as double-layered photoelectrode in ZnO dye-sensitized solar cell, Thin Solid Films, 539 (2013) 260-266.
Online since: September 2020
Authors: Pusit Pookmanee, Chanchana Thanachayanont, Sukon Phanichphant, Piyarat Somsri
The structure was confirmed by comparison with the Joint Committee on Powder Diffraction Standard (JCPDS) Card file No.005-0661 [13, 14].
Multi-phase of monoclinic structure of copper oxide (CuO) and monoclinic structure of copper nitrate hydroxide (Cu2(OH)3NO3), Figure1 (a, b), were obtained and corresponded with Joint Committee on Powder Diffraction Standards (JCPDS) Card file No.005-0661 [13, 14] and Joint Committee on Powder Diffraction Standards (JCPDS) Card file No.015-0014 [15, 16], respectively.
A single phase of monoclinic structure of CuO microparticle (Figure1 (c, d)) was obtained without calcination steps and corresponded with JCPDS Card file No.005-0661 (space group P4/nm, a = 4.68 Å, b = 3.42 Å and c = 5.12 Å) [13, 14].
Powder Diffraction File, Card No.005-0661, Swarthmore, PA
Li, Enhancing photoelectrochemical activity with three-dimensional p-CuO/n-ZnO junction photocathodes, Sci.
Online since: February 2026
Authors: Mohamad Hafiz Mamat, Noor Asnida Asli, Mohd Hanapiah Abdullah, Nor Diyana Md. Sin, Mohamad Zhafran Hussin, Fatimah Khairiah Abd Hamid, Shahirah Ahmad Kamal
On top of that, ZnO is naturally non-toxic and cost-effective.
The patterns in Fig. 2 display characteristic diffraction peaks consistent with the hexagonal wurzite structure of ZnO (JCPDS card no. 36-1451) and the tetragonal rutile structure of SnO2 (JCPDS card no. 41-1445) at various doping concentrations [24, 28].
The likely reasons are that excessive Sn leads to defect clustering or secondary phase formation, reduces the number of available adsorption sites, and increases charge-carrier recombination due to trap states [34].
Rusop, Preparation of aligned ZnO nanorod arrays on Sn-doped ZnO thin films by sonicated sol–gel immersion fabricated for dye-sensitized solar cell, Adv.
Lupan, Sensing characteristics of tin-doped ZnO thin films as NO₂ gas sensor, Sens.
Online since: October 2014
Authors: Hui Xia Lan, Shan Hong Lan, Ping Ma, Heng Zhang, Jian Zhang, Hui Jie Li
In the presence of catalyst, H2O2 can produce a large number of free radicals, improve the ability of oxidation at the same time, improve the efficiency of wastewater treatment, and won't produce sludge, solve the problems of Fenton oxidation.
Fig.1 ZnO XRD at 500 ˚C Fig.2 ZnO TEM at 500 ˚C As showed in Fig.1, the diffraction peak position and intensity of ZnO was same with JCPDS (No.36-1451) card of pure ZnO, six hexagonal wurtzite structure, and no other peaks of impurities, showed that the purity of ZnO was high.
Effect of ZnO addition on the treatment effect.
But when the ZnO content is too high, ZnO will play the role of masking agent, affect the reaction.
Therefore, the best dosage of ZnO is 4g/L.
Online since: February 2012
Authors: Ji Yao Guo, Xv Zheng, Min Zhang, Xiao Cai Yu, Dong Dong Hu
Introduction The occurrence of marine oil spill, particularly during oil extraction, transport and refinery process, leads to the direct discharge of a large number of dangerous pollutants contained in oil-effluent into ocean, and consequently triggers tremendous ecological and economic problems [1, 2].
Synthesis of Nano-scale ZnO.
The obtained spectra has the ZnO main peaks which are in agreement with the 36-1451 standard card from JCPDS.
(a) SEM images of nanometer ZnO particle; (b) XRD pattern of nanometer ZnO particle.
A possible reason for this phenomenon is that a large number of electron-hole pairs generate for much more ZnO particles exist under UV illumination.
Online since: December 2012
Authors: Rameshwar Rao, K. Venkateswara Rao, V. Rajendar
The ZnO nano powder obtained was further characterized.
Results and Discussion X-Ray diffraction (XRD): Internsity(a.u) 20 30 40 50 60 70 80 (1 0 1) (1 0 0) U0A100 U20A80 U80A20 U60A40 U40A60 U100A0 2θ (degree) ZnO - JCPDF Card number 36-1451 (0 0 2) (1 0 2) (2 0 2) (1 0 3) (1 1 2) (2 0 0) (2 0 1) (1 1 0) Fig 1.
It can be observed that very intense single hexagonal ZnO phase with P63mc structure (JCPDS 36-1451) has been obtained.
Particle size analyzer of ZnO solid solution.
The FTIR spectrum of ZnO is shown in Figure 5.
Online since: October 2021
Authors: Somenath Chatterjee, Parita Basnet, Pankaj Kumar Jha, Amlan Gupta
In underdeveloped countries, higher outbreaks of bacterial infections from increased numbers of pathogenic strains increased antibiotic resistance and occasional bacterial mutations have caused serious health hazards, especially in the infant population [1].
Fig. 1 represents a surge in the number of peer-reviewed indexed articles over the years in Pubmed for nanostructures/therapeutic use as well as on bacteria.
Further, a small number of bacteria was taken out using a sterile rod and added to peptone water in a sterile test tube for ~2 h to allow bacterial growth which was visually observed through turbidity in the solution. 1.6.
In the case of UZ sample, the diffraction peaks from the pure ZnO sample may be indexed to the hexagonal phase of the zincite structure (JCPDS No. 1-1136), without any impurity peaks [31].
Hence, the peaks corresponding to 2θ values of 38.22ᴼ, 44.37ᴼ, and 64.57ᴼ may be assigned to both Au and Ag (marked by ¶ in Fig. 2 (a)) with miller indices (111), (200) and (220), respectively, for face centered cubic (FCC) structure of Au and Ag according to JCPDS card No. 65-2870 and JCPDS card No. 65-2871, respectively [32,33].
Online since: March 2014
Authors: Tie Kun Jia, Fan Cheng Meng, Hai Shen Ren, Cheng Liu, Xiao Lei Zhang
The deflection peaks can be perfectly assigned to the standard value of AlOOH (JCPDS card number 21-1307).
When the precursor was calcined in air at 800 °C and 1000 °C for 2 h, respectively, both the deflection peaks of the product were in agreement with the standard data of orthorhombic γ-Al2O3 (JCPDS card number 50-0741).
Kim, Al2O3 nanotubes fabricated by wet etching of ZnO/Al2O3 core/shell nanofibers, Adv.
Li, A CTAB-assisted hydrothermal orientation growth of ZnO nanorods, Mater.
Online since: August 2015
Authors: Rosari Saleh, Nur Afifah, Nadia Febiana Djaja
The XRD patterns of all samples were verified by comparison with the JCPDS data.
When the patterns were compared with JCPDS card No. 1011148, it was found that all peaks observed at 2θ values of 31°, 34°, 36°, 47°, 56°, 62°, 66°, 68°, and 69° consistent with hexagonal wurtzite (100), (002), (101), (102), (110), (103), (200), (112) and (201) spacings, respectively.
The FTIR spectra of pure Fe-doped ZnO nanoparticles and Fe-doped ZnO /MMT nanoparticles are shown in Fig. 2.
The g-values, line width and peak area corresponding to number of spins participating in the production of the both signals are displayed in Table 2.
In comparison to pure Fe-doped ZnO, the Fe-doped ZnO /MMT nanocomposites exhibited substantially enhanced activity.
Online since: February 2011
Authors: W. Wu, X.H. Xiao, T.C. Peng, C.Z. Jiang
Up to now, there are a great number of publications reported that the ZnO thin films grown onto the silicon, sapphire and glass substrates [10-12], but there are scarce reports described that the ZnO thin films grown onto the Ni layers.
And then ZnO thin films were prepared another 2 inch target of ZnO (purity 99.999%) in Ar and O2 plasma (Ar/O2 gas ratio is 5:3).
The above results reveal that the as-deposited film was ZnO thin film.
In order to study the effect of thermal annealing on the surface morphology of the ZnO films, Fig. 2 depicts the morphology evolution of ZnO films on the Ni layers during the post-annealing treatment.
Moreover, the spindle ZnO thin films on the Ni layers were possesses a polycrystalline wurtzite structure with a preferred (002) orientation and all peaks are in good agreement with the JCPDS card 36-1451.