Sort by:
Publication Type:
Open access:
Publication Date:
Periodicals:
Search results
Online since: April 2012
Authors: Zhou Yue
Design of Wireless Intelligent Electronics Card Four-element Rectangular Micro-strip Antenna Array
Zhou Yue
Department of Communication and Control Engineering, Hunan University of Humanities and Science and Technology, Loudi, Hunan, 417001, China
yuezhou2000@163.com
Keywords: wireless intelligent electronic card, four-element rectangular micro-strip antenna array, radio frequency identification technology
Abstract.
With the basic necessities of daily life are closely related to the wireless smart card already substantial popularity of electronics and applications, scientific research institutes at home and abroad, and smart card companies in the development and application of inputs are many human and material resources, has also been made with a bright future results.
Abroad in order to prevent the parking lane between the wireless wake-up signals interfere with each other, be able to use the microwave absorption characteristics of the material into the isolation plate, then the use of these isolation plate separation between the lanes, but the wake-up signal when the leak situation has happened, but the cost of this design is more expensive, but also near the lane leading to the wireless smart card being erroneous wake-up [1].
Journal of System Simulation. 2007,6(11):2603~2605
With the basic necessities of daily life are closely related to the wireless smart card already substantial popularity of electronics and applications, scientific research institutes at home and abroad, and smart card companies in the development and application of inputs are many human and material resources, has also been made with a bright future results.
Abroad in order to prevent the parking lane between the wireless wake-up signals interfere with each other, be able to use the microwave absorption characteristics of the material into the isolation plate, then the use of these isolation plate separation between the lanes, but the wake-up signal when the leak situation has happened, but the cost of this design is more expensive, but also near the lane leading to the wireless smart card being erroneous wake-up [1].
Journal of System Simulation. 2007,6(11):2603~2605
Online since: October 2007
Authors: Bibhu P. Swain
Swain
National Research Laboratory of Charged Nanoparticle
School of Materials Science and Engineering
Seoul National University, Seoul, South Korea
Phone- 8228809152, Fax- 8228809152
Keywords:- HWCVD, Residual stress, nc-Si, Raman spectra
Abstract
p doped nano-crystalline silicon (nc-Si) were deposited by hot wire chemical
vapour deposition (HWCVD) using SiH4, H2 and B2H6 precursors. nc-Si was
characterized by XRD, Raman and residual stress.
[2] Hyung Kew Lee, Seung Yeop Myong, Koeng Su Lim and Euisik Yoon, Journal of Non-Crystalline Solids, Vol. 316 (2003), p. 297-301
[2] Hyung Kew Lee, Seung Yeop Myong, Koeng Su Lim and Euisik Yoon, Journal of Non-Crystalline Solids, Vol. 316 (2003), p. 297-301
Online since: April 2014
Authors: Kun Li Mao
References
[1] Nam Pyo Suh: Axiomatic design-advanced and application (Oxford University Press, London 2001)
[2] Longying Zhu, Rupeng Zhu, Zhengxun Liu: Machine Design and Research Vol. 8 (2004), p.43 (in Chinese)
[3] Zhengbi Luo, Xuejun Yu: Machine and Metal Vol. 4 (2006), p.87 (in Chinese)
[4] Ping Wang, Deping Gao: Mechanical Science and Technology for Aerospace Engineering Vol. 7 (2004), p.873 (in Chinese)
[5] Kai Zhou: Aerospace Manufacturing Technology Vol. 4 (2004), p.23 (in Chinese)
[6] Xianfu Cheng, Renbin Xiao: Transactions of the Chinese Society for Agricultural Machinery Vol. 3(2007), p.117 (in Chinese)
[7] Gang Liu, Yaozu Lu, Jinyue Tian, Qing Zhang: Journal of Machine Design Vol. 7(2007), p.3 (in Chinese)
[8] Kunli Mao: Advanced Materials Research Vols.834-836 (2014), p1476
Online since: September 2013
Authors: Zhi Yuan Zeng, Ying Xu
Acknowledgement
Jiangxi Science and Technology Program (20111BBE50029), Jiangxi Provincial Department of Education Project (DB201103093)
References
[1] M.
Spong, Reduction-based control of three dimensional bipedal walking robots, International Journal of Robotics Research 29 (6) (2010) 680–702
Advanced Materials Research Vols. 503-504 (2012) 82-85
Spong, Reduction-based control of three dimensional bipedal walking robots, International Journal of Robotics Research 29 (6) (2010) 680–702
Advanced Materials Research Vols. 503-504 (2012) 82-85
Online since: August 2013
Authors: Shi Gang Shen, Li Ya Xia, Dong Jun Gong
Determination of the Geographic Origin of Rice by Chemometrics with the Ethyl Acetate Extracts from Rice
Shigang Shen* a, Liya Xiab and Dongjun Gongc
College of Chemistry & Environmental Science, Hebei University, Baoding, China
Key Laboratory of Medical Chemistry and Molecular Diagnosis, Ministry of Education, Baoding, China
College of Quality & Technical Supervision, Hebei University, Baoding, China
ashensg@hbu.cn, bxialiya@126.com, cGongdongjun@sina.com
Keywords: Rice, geographic origin, high performance liquid chromatography, principal component analysis, linear discriminant analysis, ethyl acetate extracts
Abstract.
Materials.
Journal of Liquid Chromatography & Related Technologies, Vol. 34(2011), p.1952–1964
Materials.
Journal of Liquid Chromatography & Related Technologies, Vol. 34(2011), p.1952–1964
Online since: January 2009
Authors: Jian Zhu, Shi Xing Jia, Long Zhang
Introduction
In recent years Pyrex glass is an important mainstream material which can be commonly used in
micro-inertial(such as MEMS gyro and accelerator) devices, microliquid chips, micro photoelectron
devices, pressure sensors and so on[3,4].
Table.1 the contrast of the proportion and effects of glass etching solutions Mask material proportion of corrosion solution Temp (℃) velocity (nm/min) the ratio of etching depth to the lateral undercutting State of the Etched surface Al ①HNO3:H2O: NH4F ( 126:60: 5)[7] 20-25 ~2200 1.35 rough Photo resist or Cr/ Au ②40%NH4F:49%HF (5:1) 40 102 1.13 smooth Photo resist + Cr/Au ③ HF:HCL:H2O (3:6:10) 20-25 650 0.96 smooth relatively Photo resist or Al ④ STS 320 RIE CF4+O2[7] 31 1.15 smooth relatively Solution① has very smart reactions in the process, the depth was etched too fast to control accurately and the fringe effects are easily produced because the etching velocity of the edge is faster than the center region.
GSG(glass-silicon-glass) micro-fluidic devices with the glass via-hole etching technology References [1] M.Bu, T.Melvin,G.Ensell,J.S.Wilkinson and A.G.R.Evans: New deep glass etching technology, http:www.micro.ecs.ac.uk/mems/index.html [2] Method of forming a via hole through a glass wafer: http:www.patentstrom.us/patents /7084073/ fulltext.htm [3] A.Q.Liu,A.B.Yu,M.F.Karim,M.Tang: RF MEMS switches and integrated switching circuits, Journal of semiconductor technology and science,Vol.7,No.3,2007 [4] Chiung-Wen Lin,Hsueh-an Yang, Leonardo Wang,Weileun Fang: Applied through-wafer interconnections and anodic bonding in SOI-MEMS wafer level packaging
Table.1 the contrast of the proportion and effects of glass etching solutions Mask material proportion of corrosion solution Temp (℃) velocity (nm/min) the ratio of etching depth to the lateral undercutting State of the Etched surface Al ①HNO3:H2O: NH4F ( 126:60: 5)[7] 20-25 ~2200 1.35 rough Photo resist or Cr/ Au ②40%NH4F:49%HF (5:1) 40 102 1.13 smooth Photo resist + Cr/Au ③ HF:HCL:H2O (3:6:10) 20-25 650 0.96 smooth relatively Photo resist or Al ④ STS 320 RIE CF4+O2[7] 31 1.15 smooth relatively Solution① has very smart reactions in the process, the depth was etched too fast to control accurately and the fringe effects are easily produced because the etching velocity of the edge is faster than the center region.
GSG(glass-silicon-glass) micro-fluidic devices with the glass via-hole etching technology References [1] M.Bu, T.Melvin,G.Ensell,J.S.Wilkinson and A.G.R.Evans: New deep glass etching technology, http:www.micro.ecs.ac.uk/mems/index.html [2] Method of forming a via hole through a glass wafer: http:www.patentstrom.us/patents /7084073/ fulltext.htm [3] A.Q.Liu,A.B.Yu,M.F.Karim,M.Tang: RF MEMS switches and integrated switching circuits, Journal of semiconductor technology and science,Vol.7,No.3,2007 [4] Chiung-Wen Lin,Hsueh-an Yang, Leonardo Wang,Weileun Fang: Applied through-wafer interconnections and anodic bonding in SOI-MEMS wafer level packaging
Online since: October 2014
Authors: Bing Feng Qian, Xi Pei Ma
Recent Activities on Sensing and Adaptive Control of Arc Welding[C],Proceedings of the 3rd International Trends in Welding Science and Technology Gatlinburg,USA, S.
Vitek, ASM International Materials Park, Ohio, 1992, p.833~842
Welding Journal 2005, Vol.26 (12), p.32 ~ 34
Vitek, ASM International Materials Park, Ohio, 1992, p.833~842
Welding Journal 2005, Vol.26 (12), p.32 ~ 34
Online since: September 2011
Authors: Zhong Gen Liu, Xiao Hong Liu, Zhong Sen Yang, Xiao Feng Liang
The paper’s(3)(4) results indicated that the main factors which influence the subgrade strength are the kinds and gradations of filling materials, moisture, compactness, examination method and so on. we can ensure the subgrade strength through controlling the above factors.
References [1] Tongzhiya Yuyingtao Application of Impact Compaction Technique in High Earth Fill Subgrade, North Communication No.1, 2007 [2] Likan, the relation between subgrade compaction and subgrade bearing ability, Science and Technology Consulting Herald 2007.11 [3] Zhao siyuan, lu dingfang, wangjinrui, analysis of the influence factors about subgrade compacting degree, oil field engineering on earth, 2007.2 [4] HUANG Chang-wei,HUANG Xiao-jian,Control Measures of the Degree of Compaction of Grade Classified Highways, journal of guang dong communication polytechnic March.2004 [5] Deng xuejun, Road Subgrade And Pavement Engineering, china communications press, 2005.8
References [1] Tongzhiya Yuyingtao Application of Impact Compaction Technique in High Earth Fill Subgrade, North Communication No.1, 2007 [2] Likan, the relation between subgrade compaction and subgrade bearing ability, Science and Technology Consulting Herald 2007.11 [3] Zhao siyuan, lu dingfang, wangjinrui, analysis of the influence factors about subgrade compacting degree, oil field engineering on earth, 2007.2 [4] HUANG Chang-wei,HUANG Xiao-jian,Control Measures of the Degree of Compaction of Grade Classified Highways, journal of guang dong communication polytechnic March.2004 [5] Deng xuejun, Road Subgrade And Pavement Engineering, china communications press, 2005.8