Search Options

Sort by:

Sort search results by

Publication Type:

Publication Type filter

Open access:

Publication Date:

Periodicals:

Periodicals filter

Search results

Online since: October 2015
Authors: Seyed Majed Modaresi, Ali Nakhaei Pour
The mean absolute relative residual (MARR) is reported as a measure of the precision of the fit: (13) Where n is the number of included data points. 3.
All the diffraction peaks can be indexed to cubic hematite structure of Fe2O3 nanoparticles, which is in good agreement with the literature value (JCPDS Card No. 33-0664).
Wojciechowski, Carbon number distribution of fischer — Tropsch CO-hydrogenation products from precipitated iron catalysts, The Canadian Journal of Chemical Engineering, 63 (1985) 826-834
Online since: March 2023
Authors: Bhupendra Chudasama, Yashpreet Yashpreet
These observed peaks matches well with those represented in JCPDS card number 00-051-0118 for LSMO.
Online since: June 2015
Authors: Tokeer Ahmad, Ruby Phul
A large number of compounds, mostly paramagnetic substances, have been assayed as potential MRI contrast agents [19, 20].
Electron microscopic studies can determine the size of nanoparticles [171-174] and reports the gross particle size of the core i.e., a number weighted mean value.
The results are consistent with the standard values for α-Fe2O3 (JCPDS card No. 89-8104).
The XRD pattern of the Fe3O4 nanocrystals are in good agreement with the standard values for magnetite (JCPDS card No. 88-315) with crystal parameters: cubic structure, space group: Fd-3m, a = 8.375.
sample number sodium oleate (g) oleic acid (mL) ethanol (mL) a 1.92 20 40 b 1.92 17 43 c 1.68 20 40 Fig. 13.
Online since: November 2014
Authors: B.P. Chandra, V.K. Chandra, Piyush Jha
In fact, larger particles upto a few hundreds of nanometers would be still interesting as long as the number of surface atoms is comparable to the number of bulk atoms.
There are three main methods for indexing a diffraction pattern: (i) comparing the measured XRD pattern with the standard data base (JCPDS-cards), (ii) analytical methods, and (iii) graphical methods.
The broadening of the peak is due to a small number of crystal planes.
There are a number of drawbacks to the TEM technique.
This ranges from luminescent paints, protective clothing, signs and house numbers.