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Van Zelt et al, A. van Nee, R.
El-Tanany, S.

A. and Al-Sherbini, A.
[45] Elmorsi TM, Riyad YM, Mohamed ZH, Abd El Bary HMH, J Hazard Mater,174, (2010)352.

El-Sayed, Chem.
Gadret, M, et al., Correlation between Molecular Packing and Optical Properties in Different Crystalline Polymorphs and Amorphous Thin Films of mer-Tris(8-hydroxyquinoline)aluminum(III), J.

In the study of Mäntyjärvi et al. [22], an integration analysis between Design for Assembly and Manufacturing (DFMA) and DFAM has been performed.
Mäkikangas, Design for additive manufacturing in extended DFMA process, Proceedings of the International Conference on Materials Science and Engineering ICMSE-RAC 2018, (2018), New Borg El-Arab, Alexandria, Egypt – SUBMITTED

El, Basic Mechanisms of Threshold-Voltage Instability and Implications for Reliability Testing of SiC MOSFETs, in IEEE Transactions on Electron Devices, vol. 62, no. 2, pp. 316-323, Feb. 2015, doi: 10.1109/TED.2014.2356172
Lelis et al., Time dependence of bias-stress-induced SiC MOSFET threshold-voltage instability measurements, IEEE Trans.

Feng, A.L.
Samy El-Shall: Applied Surface Science 127 (1998) 330-338

Al-Qadi, I.M.
El-Hamalawi, M.W.

C Mn Si Al P N S Mo Ti Nb. 169 1710 1710 54 5 3 3 Tr.
Rauch, E.L.

Theocaris, et al , Engng.
El-Sheikhy, Ph.

El-centro wave(1940),Taft wave(1952) and Ninghe wave(1976), were respectively used to simulate earthquake excitations for calculating the structural elastoplastic responses.
Comput struct 1999(169)：1-18 [5] Zhu K,Al-Bermani FGA, Kitipornchai S.