Books by Keyword: Defect Monitoring

Collection of selected, peer reviewed papers from the GADEST 2015: Gettering and Defect Engineering in Semiconductor Technology, September 20-25, 2015, Bad Staffelstein, Germany.

The 71 papers are grouped as follows: Chapter 1: Growth of Mono- and Multi-Crystalline Silicon;                     Chapter 2: Passivation and Defect Studies in Solar Cells;                Chapter 3: Intrinsic Point Defects and Dislocations in Silicon;                 Chapter 4: Light Elements in Silicon-Based Materials;                      Chapter 5: Properties and Gettering of Transition Metals in Silicon;             Chapter 6: Radiation- and Impurity-Related Defect Studies in Silicon and Germanium;                                   Chapter 7: Thermal Properties of Semiconductors;                           Chapter 8: Luminescence and Optical Properties of Semiconductors;         Chapter 9: Nano-Sized Layers and Structures;                               Chapter 10: Wide-Bandgap Semiconductors;                          Chapter 11: Advanced Methods and Tools for Investigation of Semiconductor Materials