Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The papers which make up this volume reflect the very diverse nature of nondestructive evaluation; covering as they do topics ranging from traditional NDE to newly developing NDE methods such as structural health monitoring; where nondestructive technologies are rapidly progressing by integrating emerging technologies from various fields.

Defects and Diffusion in Semiconductors I

Edited by: Dr. David J. Fisher

Online since: July 1998

Description: This issue, and the ones which will follow year-by-year, can be regarded not only as supplements to the recent special 10-year retrospective volumes on Diffusion in Silicon (volumes 153-155) and Diffusion in III-V Compounds (volumes 157-159), but also as a return to the 'regular business' of Diffusion and Defect Forum's 30-year project of succinctly summarising recent progress in these fields.

The present volume abstracts those papers published during the approximate period from June 1997 to June 1998. Earlier papers have been included in order to make sure that the coverage is contiguous with volume 152 of Defect and Diffusion Forum; the most recent 'regular' issue. Due to vagaries in publication schedules, the 1998 cut-off point is not exact, but any omissions will be corrected in the next annual retrospective. General priority has been given to the most accessible work and, in particular, to those papers which furnish original data or report important new techniques, phenomena or anomalies. Lesser priority has been given to reviews and to entirely theoretical work.

Advances in Engineering Materials

Edited by: S. Hampshire, M. Buggy, B. Meenan and N. Brown

Online since: March 1995

Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The 1990's so far have seen significant developments in Materials Technology in a variety of materials classes such as Metals and Alloys, Ceramics and Coatings, Biomaterials, and Surfaces and Interfaces.