Books by Keyword: Metrology

Books

Edited by: Prof. Subhan Namazov, Prof. Nizami Yusubov and Prof. Sylvio Simon
Online since: April 2024
Description: This edition includes selected articles presented at the 2nd International Scientific-Practical Conference "Machine Building and Energy: New Concepts and Technologies" (MBENCT 2023, December 4-5, 2023, AzTU, Baku, Azerbaijan). The purpose of the Conference was to formulate new challenges that create a scientific and technological basis that determines the increase in environmental safety and the economic efficiency of the infrastructure in connection with the development of production and energy fields. The publication will be useful to specialists in machine-building, energy and modern communication and information technologies.
Edited by: Prof. Domingo Morales-Palma, Prof. Andrés J. Martínez-Donaire, Prof. Marcos Borrego Puche, Prof. Gabriel Centeno Báez and Prof. Carpoforo Vallellano
Online since: October 2023
Description: This book contains full text peer-reviewed papers presented at the 10th Manufacturing Engineering Society International Conference (MESIC 2023) held in Sevilla (Spain) from 28 to 30 June 2023 and covers a wide range of research results and engineering solutions on the topics of advances and innovations in manufacturing processes, additive manufacturing, trends in manufacturing systems and automation, metrology and quality in manufacturing, Industry X.0 and digital manufacturing, as well as manufacturing engineering in society. This publication will be helpful to many researchers and engineers in the industrial area.
Edited by: Khairurrijal, Kuwat Triyana and Shidiq Nur Hidayat
Online since: July 2015
Description: Collection of selected, peer reviewed papers from the 2014 International Seminar on Instrumentation, Measurement and Metrology, August 27-28, 2014, Yogyakarta, Indonesia.
The 58 papers are grouped as follows:
Chapter 1: Sensors and Instrumentation;
Chapter 2: Methods of Measurement and Metrology
Edited by: Krzysztof Stępień
Online since: February 2015
Description: International Symposium on Measurement and Quality Control (ISMQC) is one of the most important scientific events that is normally held once in every three years in the field of measurements and quality control. During ISMQC 2013 that were selected by Programme Committee to be published in the Special Issue of “Key Engineering Materials” and one additional paper whose subject fits perfectly the scope of the symposium.
Edited by: Juan José Aguilar Martín and José Antonio Yagüe Fabra
Online since: June 2014
Description: Collection of selected, peer reviewed papers from the 5th International Conference of Manufacturing Engineering Society (MESIC 2013), June 26-28, 2013, Zaragoza, Spain.
The 28 papers are grouped as follows:
I. Industrial Metrology,
II. Industrial Quality,
III. Modeling and Simulation in Manufacturing Engineering,
IV. Teaching Manufacturing and Industrial Heritage
Edited by: Wu Fan
Online since: October 2011
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
These proceedings comprise fully-refereed papers presented at the conference. The main conference theme was Mechanical and Aerospace Engineering, and the main goal of the event was to provide an international scientific forum for the exchange of new ideas in a number of fields and for in-depth discussions with peers from around the world. Core areas of mechanical and aerospace engineering are covered, together with multidisciplinary, interdisciplinary research and applications; thus making the work an excellent guide to those topics.
Edited by: Yusaku Fuji and Koichi Maru
Online since: October 2010
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The aim of this unique collection of peer-reviewed papers is to deepen the mutual understanding of researchers in precision measurement and related fields and to to initiate joint international research among participants.
Edited by: Yuri Chugui, Yongsheng Gao, Kuang-Chao Fan, Roald Taymanov and Ksenia Sapozhnikova
Online since: May 2010
Description: This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, industry and biomedicine, intelligent measuring instruments and systems for industry and transport, measurements of geometrical and mechanical quantities, measurements and metrology for humanitarian fields and education in measurement science.
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