Books by Keyword: Nanometrology

Books

Edited by: Robert Schmitt and Harald Bosse
Online since: May 2014
Description: Collection of selected, peer reviewed papers from the 11th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2013), July 1-3, 2013, Aachen, Germany.
The 60 papers are grouped as follows:
Chapter 1: Metrology for SI,
Chapter 2: Position & Displacement Metrology,
Chapter 3: Micro- and Nanometrology,
Chapter 4: Macrometrology,
Chapter 5: Optical Metrology,
Chapter 6: Sensors and Actuators,
Chapter 7: Material Properties' Characterization,
Chapter 8: Intelligent Instruments for Automation,
Chapter 9: Management of Measurement Processes,
Chapter 10: Calibration and Machine Tool Performance,
Chapter 11: Trends in Production Technology,
Chapter 12: Measurements, Modeling and Simulation in the Humanitarian Field
Edited by: Wu Fan
Online since: October 2011
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
These proceedings comprise fully-refereed papers presented at the conference. The main conference theme was Mechanical and Aerospace Engineering, and the main goal of the event was to provide an international scientific forum for the exchange of new ideas in a number of fields and for in-depth discussions with peers from around the world. Core areas of mechanical and aerospace engineering are covered, together with multidisciplinary, interdisciplinary research and applications; thus making the work an excellent guide to those topics.
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