This special collection focuses on measurement science and metrology: micro- and nano-measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, industry and biomedicine, intelligent measuring instruments and systems for industry and transport, measurements of geometrical and mechanical quantities, measurements and metrology for humanitarian fields and education in measurement science. The aim was to present the current state and evolution of measuring technology and intelligent instruments, to highlight novel technologies for science, industry and engineering, and to spot promising ways towards further development, of new technologies for measurement, at the international level. The special collection was established following the results of the 12th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2015, September 22 - 25, 2015, Taipei, Taiwan).

Measurement Technology and Intelligent Instruments XI

Edited by: Robert Schmitt and Harald Bosse

Online since: May 2014

Description: Collection of selected, peer reviewed papers from the 11^th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2013), July 1-3, 2013, Aachen, Germany.
The 60 papers are grouped as follows:
Chapter 1: Metrology for SI,
Chapter 2: Position & Displacement Metrology,
Chapter 3: Micro- and Nanometrology,
Chapter 4: Macrometrology,
Chapter 5: Optical Metrology,
Chapter 6: Sensors and Actuators,
Chapter 7: Material Properties' Characterization,
Chapter 8: Intelligent Instruments for Automation,
Chapter 9: Management of Measurement Processes,
Chapter 10: Calibration and Machine Tool Performance,
Chapter 11: Trends in Production Technology,
Chapter 12: Measurements, Modeling and Simulation in the Humanitarian Field