Description: The volume contains selected, peer reviewed papers from the 2012 International Conference on Nano Materials and Electric Devices (ICNMED 2012), December 19-20, 2012, Hong Kong.
The papers are grouped as follows:
Chapter 1: Material Science Engineering and Tecnology;
Chapter 2: Nano Materials and Technologies;
Chapter 3: Advanced Mechanical Engineering and Mechatronics Application;
Chapter 4: Electric and Magnetic Engineering, Electronics and Information Technology Application.

Advanced Measurement and Test X

Edited by: Yanwen Wu

Online since: June 2010

Description: This special collection on Advanced Measurement and Test is dedicated to the electronic testing of devices, boards and systems and covers the complete cycle: from design verification, design-for-testing, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, failure analysis and back to process and design improvement. Design, testing and yield professionals were invited to confront the challenges which the industry faces, and to learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers and test engineers.