Books by Keyword: Precision Metrology

Description: Collection of selected, peer reviewed papers from the 5th International Conference on Asian Society for Precision Engineering and Nanotechnology (ASPEN 2013), November 12-15, 2013, Taipei, Taiwan.
The 124 paper are grouped as follows:
Precision Metrology,
Precision Machining,
Optical Measurement,
Manufacturing Systems and Machine Tools,
Motion Control/ Polishing and Grinding,
Advanced Moulding and Precision Forming/ Advanced Technologies,
Non-Conventional Machining,
Precision Machine Design & Mechatronics,
High Precision Mechatronics / Robotics,
Others

Description: The 3rd International Conference on Precision Instrumentation and Measurement (CPIM 2011) was held in Xiangtan City, China. It served as an excellent opportunity for experts to strengthen academic exchanges and to enhance the development of precision instrumentation and measurement.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The 129 peer-reviewed papers reveal not only novel ideas and results, and work-in-progress, but will also stimulate future research activities in the area of precision instrumentation and measurement.

Description: Volume is indexed by Thomson Reuters BCI (WoS).
Measurement, rigorously defined as ‘ascertaining the size, amount or degree of a measurand by instrumental comparison with a standard unit or by indirect calculation based upon theory’, is what makes science and technology different to imagination. Measurement is essential in industry, commerce and daily life. In the manufacturing industry in particular, measurement and instrumentation technology play increasingly important roles not only in the traditional field of manufacturing but also in the new fields of micro/nano technology and bioengineering.
This book presents recent advances in the use of measurement and instrumentation in the manufacturing industry. A wide range of topics are covered including: micro/nano-metrology，precision measurements，online and in-process measurements，surface metrology，optical metrology and image processing，bio-measurement, sensor technology，intelligent measurement and instrumentation，uncertainty, traceability and calibration and signal-processing algorithms.