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Books by Keyword: Quantitative Analysis
Books
Edited by:
Dayun Xu
Online since: September 2013
Description: Collection of selected, peer reviewed papers from the 2013 International Conference on Intelligent Materials and Measurement (ICIMM 2013), July 27-28, 2013, Singapore.
The 74 papers are grouped as follows:
Chapter 1: Materials Science and Materials Processing Technology;
Chapter 2: Instrumentation and Measuring Technology, Data Acquisition and Analysis;
Chapter 3: Applied Mechanics and Civil Engineering;
Chapter 4: Manufacture Engineering.
The 74 papers are grouped as follows:
Chapter 1: Materials Science and Materials Processing Technology;
Chapter 2: Instrumentation and Measuring Technology, Data Acquisition and Analysis;
Chapter 3: Applied Mechanics and Civil Engineering;
Chapter 4: Manufacture Engineering.
Edited by:
Paolo Scardi and Robert E. Dinnebier
Online since: May 2010
Description: Volume is indexed by Thomson Reuters BCI (WoS).
The main focus of this special topic volume is the development and possibilities of the MACRO language within TOPAS, with a specific session dedicated to WPPM. The collection is presented here in the form of a “macro tutorial” for the benefit of the entire powder diffraction community. More than a collection of standard scientific papers, the contributions to this special issue provide methods, tutorials and practical suggestions and solutions for the proper use of TOPAS and WPPM in a number of applications; ranging from the most common to the most refined and specific cases.
The main focus of this special topic volume is the development and possibilities of the MACRO language within TOPAS, with a specific session dedicated to WPPM. The collection is presented here in the form of a “macro tutorial” for the benefit of the entire powder diffraction community. More than a collection of standard scientific papers, the contributions to this special issue provide methods, tutorials and practical suggestions and solutions for the proper use of TOPAS and WPPM in a number of applications; ranging from the most common to the most refined and specific cases.
Edited by:
R. Delhez and E.J. Mittemeijer
Online since: April 1998
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The EPDIC-5 Proceedings present the latest papers in this successful series of European Conferences on Powder Diffraction. They demonstrate the evergrowing interest from materials scientists, physicists, chemists, geologists - both industrial and academic- all having a direct interest in the practical application of this powerful and non-destructive method of analysis.
Part 1 comprises some 75 contributions, with sections on Methodological Developments, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction describing the latest ideas in these fields. Subjects such as Microstructure of Materials, Texture, Quantitative Phase Analysis and Crystal Structure Determination are also addressed; as in previous editions of these conference proceedings. An important step forward in materials analysis is now occurring: scientists and engineers are becoming more and more conscious of the fact that, by using these techniques, it is possible to obtain quantitative information from the same set of measurements, of material characteristics, that determine material properties. This advance has been made possible thanks to recent instrumental developments, such as the X-ray lens -a bundle of glass capillaries- and single or double X-ray mirrors. A very useful tool, that is extensively applied -as described in a sequence of some 15 contributions-, is the in-situ (i.e. time resolved) powder diffraction technique which has resulted from the ample availability of position sensitive detectors.
The EPDIC-5 Proceedings present the latest papers in this successful series of European Conferences on Powder Diffraction. They demonstrate the evergrowing interest from materials scientists, physicists, chemists, geologists - both industrial and academic- all having a direct interest in the practical application of this powerful and non-destructive method of analysis.
Part 1 comprises some 75 contributions, with sections on Methodological Developments, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction describing the latest ideas in these fields. Subjects such as Microstructure of Materials, Texture, Quantitative Phase Analysis and Crystal Structure Determination are also addressed; as in previous editions of these conference proceedings. An important step forward in materials analysis is now occurring: scientists and engineers are becoming more and more conscious of the fact that, by using these techniques, it is possible to obtain quantitative information from the same set of measurements, of material characteristics, that determine material properties. This advance has been made possible thanks to recent instrumental developments, such as the X-ray lens -a bundle of glass capillaries- and single or double X-ray mirrors. A very useful tool, that is extensively applied -as described in a sequence of some 15 contributions-, is the in-situ (i.e. time resolved) powder diffraction technique which has resulted from the ample availability of position sensitive detectors.
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