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Books by Keyword: Spectral Measurement
Books
Edited by:
Wei Deng and Qi Luo
Online since: November 2012
Description: The 3rd International Conference on Information Technology for Manufacturing Systems (ITMS 2012) was held on the 8 and 9th September 2012 in Qingdao, China. It was intended to bring together researchers and engineers/technologists working on various aspects of materials, mechanical, electronic, computer, information and other topics.
Edited by:
Jimmy (C.M.) Kao, Wen-Pei Sung and Ran Chen
Online since: October 2012
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This work brings together some 280 peer-reviewed papers on Chemical Engineering, Metallurgical Engineering and Materials Engineering. It will certainly serve to promote the development of Chemical, Materials and Metallurgical Engineering, the strengthening of international academic cooperation and communication, and the exchange of research ideas offering, as it does, a broad overview of the latest advances in the field of Materials and Chemical Engineering.
This work brings together some 280 peer-reviewed papers on Chemical Engineering, Metallurgical Engineering and Materials Engineering. It will certainly serve to promote the development of Chemical, Materials and Metallurgical Engineering, the strengthening of international academic cooperation and communication, and the exchange of research ideas offering, as it does, a broad overview of the latest advances in the field of Materials and Chemical Engineering.
Edited by:
Ran Chen
Online since: July 2011
Description: These are the proceedings of the 2011 International Conference on the Frontier of Nanoscience and Technology (ICFNST 2011), held in Kunming, China, on September 28-29th, 2011. The aim was to provide a platform from which researchers, engineers and academics, as well as industrial professionals, from all over the world could present their research results and development activities in the fields of Nanoscience and Technology. The work thus presents an eminently up-to-date survey of the subject.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
Volume is indexed by Thomson Reuters CPCI-S (WoS).
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