Books by Keyword: Spectroscopy

Description:

The 15th conference on metallography was held on September 21-23, 2021, in Mariánské Lázně, Czech Republic. It was focused on the application of metallography in industrial practice - for the solution of production problems, elucidation of premature failure of machine components and constructions during service, breakdowns or accidents. In addition, some results of new research projects which could improve manufacturing technology or the quality of machine products were presented. Among other contributions from the conference collected in this book, individual papers deal with failure causes and fracture mechanisms, insufficient material properties and incorrect function of the components. Using metallographic analyses, which include light and electron microscopy, spectroscopic methods, and physical methods for the detection of defects, material structures are also investigated. Results are correlated with material properties, and recommendations for production improvement are given.

Description: Progress in materials science and engineering is closely related to material properties. It is because materials' performance is closely related to the microstructure. Therefore at present, many modern microscopic studying techniques are used in materials science. Those methods have evolved over decades, or even centuries, from quite rudimentary tools to highly sophisticated equipment. They are necessary for both the quality control of products and the development of new materials. The technical context of measuring materials' properties ranges from fundamental science to reasonably practical "real-world" field tests that can predict performance and—one hopes—prevent machines components failure. In this book, contributions on the following topics were particularly encouraged: optical and mechanical characterization of coarse-grained and nanostructured materials; correlative analysis of microscopic and mechanical properties of surface engineered materials; properties of a new generation of biomorphic materials; validation of the materials' performance in "real-world" tests.

Description:

Collection of selected, peer reviewed papers from the GADEST 2015: Gettering and Defect Engineering in Semiconductor Technology, September 20-25, 2015, Bad Staffelstein, Germany.

The 71 papers are grouped as follows: Chapter 1: Growth of Mono- and Multi-Crystalline Silicon;                     Chapter 2: Passivation and Defect Studies in Solar Cells;                Chapter 3: Intrinsic Point Defects and Dislocations in Silicon;                 Chapter 4: Light Elements in Silicon-Based Materials;                      Chapter 5: Properties and Gettering of Transition Metals in Silicon;             Chapter 6: Radiation- and Impurity-Related Defect Studies in Silicon and Germanium;                                   Chapter 7: Thermal Properties of Semiconductors;                           Chapter 8: Luminescence and Optical Properties of Semiconductors;         Chapter 9: Nano-Sized Layers and Structures;                               Chapter 10: Wide-Bandgap Semiconductors;                          Chapter 11: Advanced Methods and Tools for Investigation of Semiconductor Materials

Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
This special volume of 24 peer reviewed contributions cover up-to-date research results on "Structural and Chemical Characterization of Metals Alloys and Compounds". The structural and chemical characterization of different materials such as metals, alloys, ceramics, steels, composites, polymeric compounds, welding, superalloys, intermetallic compounds, and nanomaterials are included. They were prepared with different techniques. Some important topics addressed were the analytical techniques focused on the microstructural, chemical, optical, electronic, magnetic and mechanical properties of materials.