Books by Keyword: Structural Characterization

Books

Edited by: Alexander A. Lebedev, Sergey Yu. Davydov, Pavel A. Ivanov and Mikhail E. Levinshtein
Online since: January 2013
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The volume on Silicon Carbide and Related Materials is divided into 10 chapters ranging from “Bulk growth” to “Device and application”. The reports demonstrate the technical and scientific advances in the related areas: 150 mm 4H-SiC wafers are now commercially available, a significant improvement of the carrier lifetime (up to 35 ms) for n-type SiC epi-layers has been achieved, SiC diodes have a large market share in server and telecom power applications requiring the maximum efficiency, and a variety of 1- cm2, 15 kV class bipolar devices have been demonstrated, including PN Diodes, IGBTs and GTO. In general, the number of contributions devoted to application of SiC and related materials, GaN and solid solutions based on this material, and graphene is steadily increasing compared to the 2011 edition.
Edited by: A. Chamberod and J. Hillairet
Online since: January 1990
Description: This book contains a series of lectures given in a Summer School held in Aussois (France) in September 1989. It offers a global perspective on the current state-of-the-art in the rapidly emerging field of metallic multilayered structures.
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