Books by Keyword: Surface Characterisation

Books

Edited by: Prof. Rafael Ferragut, Dr. Javier Schmidt and Prof. Bernardo Barbiellini
Online since: July 2025
Description: An intensive two-day Summer School in honour of Alfredo Dupasquier was held at the Brunate Library (Como, Italy) on August 31st and September 1st 2024, before the traditional International Workshop on Positron Studies of Defects 2024 (PSD-24, 1-6 September 2024, Como, Italy). The School's lectures presented in this special edition were delivered by leading international experts in Positron Annihilation Spectroscopy (PAS).
Edited by: Yongsheng Gao, Shuetfung Tse and Wei Gao
Online since: October 2005
Description: The requirements of high precision and of high-quality components and devices in meeting the needs of modern industry and society in disciplines such as semiconductors, optics, nanotechnology, MEMS, manufacturing, biomedical and environmental engineering, make measurement technology and intelligent instruments (which sense, measure and report), more important than ever, and essential for the rapid development of information technology. Following the lead of the previous five publications (1989, 1993, 1996, 1998, 2001) in the series, “Measurement Technology and Intelligent Instruments”, this book presents the most recent advances in this important field. In all, 123 papers were contributed from many regions of the world; including China, Taiwan (China), Japan, Russia, Hong Kong (China), Germany, Australia, Austria, Canada, Korea, Poland, Slovakia and the UK and US.
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