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Books by Keyword: X-Ray Stress Measurement
Books
Edited by:
S.J.B. Kurz, Prof. Eric Jan Mittemeijer and Berthold Scholtes
Online since: September 2013
Description: This book presents the proceedings of the International Conference on Residual Stresses 9 and is devoted to the prediction/modelling, evaluation, control, and application of residual stresses in engineering materials. The state of the art is presented by the contributions of researchers from both academia and industry. New developments, on stress-measurement techniques, on modelling and prediction of residual stresses and on progress made in the fundamental understanding of the relation between the state of residual stress and the material properties, are highlighted. Focal points of interest are: simulation of stress profiles, depth-resolved stress analysis using synchrotron radiation and phase transformations in welded structures. This book offers an indispensable overview of the current understanding of the role of residual stresses in materials used in wide ranging application areas, such as, for example, microelectronic devices, sensors and actuators and machine parts, as in the automotive industry.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
Volume is indexed by Thomson Reuters CPCI-S (WoS).
Edited by:
Y. Akiniwa, K. Akita and H. Suzuki
Online since: May 2010
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
Neutron and synchrotron radiation are novel and powerful tools for stress evaluation, and are widely applied to fundamental studies in materials science and engineering, and in various industrial fields. This volume brings together the up-to-date knowledge of scientists from the academic world and industry in order to address specific topics concerning the evaluation of stresses and related phenomena using neutrons, synchrotron radiation and X-rays. Many of the presentations on stress-testing deal with samples of up to 0.5m line-pipe. Many applications of micro-beam X-ray methods are described, ranging from intragranular stress fluctuations within a grain (attributed to dislocations) to stresses in interconnects on chips. Simultaneous evaluation of tomographic and stress measurements of the same sample was shown to provide extremely clear insights into the nature and cause of damage. A major advance in the simulation of stress and strain at the mesoscopic scale has been achieved using the extended elasto-plastic self-consistent model. Such discoveries, and many others, will make this an important reference work for anyone who uses these techniques.
Neutron and synchrotron radiation are novel and powerful tools for stress evaluation, and are widely applied to fundamental studies in materials science and engineering, and in various industrial fields. This volume brings together the up-to-date knowledge of scientists from the academic world and industry in order to address specific topics concerning the evaluation of stresses and related phenomena using neutrons, synchrotron radiation and X-rays. Many of the presentations on stress-testing deal with samples of up to 0.5m line-pipe. Many applications of micro-beam X-ray methods are described, ranging from intragranular stress fluctuations within a grain (attributed to dislocations) to stresses in interconnects on chips. Simultaneous evaluation of tomographic and stress measurements of the same sample was shown to provide extremely clear insights into the nature and cause of damage. A major advance in the simulation of stress and strain at the mesoscopic scale has been achieved using the extended elasto-plastic self-consistent model. Such discoveries, and many others, will make this an important reference work for anyone who uses these techniques.
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