Characterization of Advanced Materials

Characterization of Advanced Materials

Description:

Volume is indexed by Thomson Reuters BCI (WoS).
This special-topic volume includes two review articles written by eminent scientists in India, plus original articles by researchers working in various Indian research and academic institutions. The articles describe the results of analyses carried out on important materials that are useful to human society, and many characterization techniques have been reported for the analysis of various types of material. It is expected that this work will be very useful to scientists, researchers, academics, scholars and students working at various levels in academic, research and industrial institutions.

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Info:

Editors:
R. Saravanan
THEMA:
TGM
BISAC:
TEC021000
Details:
Special topic volume with invited peer reviewed papers only.
Pages:
320
Year:
2012
ISBN-13 (softcover):
9783037852545
ISBN-13 (CD):
9783037950791
ISBN-13 (eBook):
9783038136644
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Review from Ringgold Inc., ProtoView: Two review articles and several research reports discuss the results of analysis Indian scientists have carried out on important materials useful for human society. The review articles cover probing materials by positron annihilation techniques and Mossbauer spectroscopy, and material properties and preparation techniques for magnesium indium oxide thin films. Other topics include synthesizing lanthanum nickelate and praseodymium substituted compounds by the molten salt technique, laser shot peening of 304 austenitic stainless steel without protective coating, X-ray studies on lead sulfide, the automation of a photoacoustic spectrometer for nondestructive evaluation, a comparative study of removing methylene blue by the adsorption process, and synthesizing and characterizing ligand and its metal complexes.