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Defect and Diffusion Forum Vols. 121-122
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Info:
eBook:
ToC:
Editors:
Graeme E. Murch
THEMA:
PDT, TGM, TJ
BISAC:
SCI050000, TEC008000, TEC021000
Keywords:
B2 NiAl Type Compounds, Defect Structure, Diluted Magnetic Semiconductor (DMS), Dislocation, Ductilization Mechanism, Grain Boundary Dislocation, High-TC Superconductor, L12 Al3Ti-X Type Compounds, L12 Ni3Al Type Compounds, Long Range Order, Pinning Centers, Relating Physical Properties, Semimagnetic Semiconductors, Site Occupancy, Subgrain Boundary, ZMR Silicon
Pages:
60
Year:
1995
ISBN-13:
9783908450870
ISBN-13 (CD):
9783035729948
ISBN-13 (eBook):
9783035739947
Permissions CCC:
Permissions PLS:
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