Defects and Diffusion in Semiconductors - an Annual Retrospective VIII

Defects and Diffusion in Semiconductors - an Annual Retrospective VIII

Description:

This eighth volume in the series covering the latest results in the field includes abstracts of papers which appeared between the publication of Annual Retrospective VII (Volumes 230-232) and the end of 2005 (allowing for vagaries of journal availability).

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Info:

eBook:
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ToC:
Table of contents
Editors:
Dr. David J. Fisher
DOI:
https://doi.org/10.4028/b-LN4SQh
THEMA:
TGM
BISAC:
TEC021000
Keywords:
Annealing of Defects, Antimony, Bistable System, Boron Doping, Chemical Vapor Deposition (CVD), Deep Trap States, Defect Cluster, Defect Clusters, Density Function Theory (DFT), Dislocation
Pages:
352
Year:
2005
ISBN-13 (softcover):
9783908451167
ISBN-13 (CD):
9783908451167
ISBN-13 (eBook):
9783038130338
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