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Defects in Semiconductors 14
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Info:
eBook:
ToC:
Editors:
H.J. von Bardeleben
THEMA:
TGM
BISAC:
TEC021000
Details:
Proceedings of the 14th International Conference on Defects in Semiconductors (ICDS-14), Paris, France, 1986
Pages:
1320
Year:
1986
ISBN-13:
9780878495511
ISBN-13 (CD):
9783038597391
ISBN-13 (eBook):
9783035704242
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