Defects in Semiconductors 15

Defects in Semiconductors 15

Description:

Materials Science Forum Vols. 38-41

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Info:

Editors:
G. Ferenczi
THEMA:
TGM
BISAC:
TEC021000
Details:
Proceedings of the 15th International Conference on Defects in Semiconductors (ICDS-15), Budapest, Hungary, 1988
Pages:
1506
Year:
1989
ISBN-13:
9780878495849
ISBN-13 (CD):
9783038597544
ISBN-13 (eBook):
9783035704396
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