This book contains the proceedings of Symposium L of the International Conference on Materials for Advanced Technologies, held from the 1st to the 6th of July , 2001 in Singapore. The aim of this important meeting was to bring together researchers and engineers having very different backgrounds, and thus promote free discussion and the exchange of ideas across many interdisciplinary boundaries.

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eBook:

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ToC:

Table of contents

Editors:

C.-h. Chiu, Z. Chen, H. Gao, K.Y. Lam, A.A.O. Tay

DOI:

https://doi.org/10.4028/b-8xsFEZ

THEMA:

TGM

BISAC:

TEC021000

Keywords:

Delamination, Dislocation, Electronic Structure, Finite Element Analysis (FEA), Finite Element Model (FEM), Monte-Carlo Method (MC-Method), Simulation

Details:

Proceedings of Symposium on Modeling Materials and its Applications in Advanced Technologies, Singapore, 1-6 July 2001

Pages:

300

Year:

2002

ISBN-13 (softcover):

9780878499014

ISBN-13 (CD):

9783038597193

ISBN-13 (eBook):

9783035704044

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