The volume consists of a collection of 124 peer-reviewed papers contributed by experts from all over the world. The topics covered include: new developments and applications in materials forming, subtractive, additive and joining processes, processing of advanced materials such as composites, polymers, semiconductors and bio-materials, and new development in the micro/nano-fabrication of engineering materials.

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Info:

eBook:

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ToC:

Table of contents

Editors:

Yanwen Wu

DOI:

https://doi.org/10.4028/b-s2ZMKw

THEMA:

TGM

BISAC:

TEC021000

Keywords:

Artificial Neural Network (ANN), Association Rule, BP Neural Network (BPNN), Data Mining (DM), Design, Fault Diagnosis, Genetic Algorithm (GA), High-Precision Omnibearing, Image Segmentation, Level Posture, Load Balancing, Measurement, Ontology, Optimization, Quality, Sense Organ, Support Vector Machine (SVM), Validity, Wavelet Transform (WT), Wireless Sensor Network (WSN)

Details:

Selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China.

Pages:

1586

Book Set:

2 Books set

Year:

2010

ISBN-13 (softcover):

9780878492695

ISBN-13 (CD):

9783908452133

ISBN-13 (eBook):

9783038134077

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