Silicon Carbide and Related Materials 2006

Silicon Carbide and Related Materials 2006

Subtitle:

ECSCRM 20006

Description:

Volume is indexed by Thomson Reuters CPCI-S (WoS).
Silicon Carbide (SiC), Gallium Nitride (GaN) and Diamond are wide-bandgap semiconductors which also possess extraordinary chemical, electrical and optical properties that make them uniquely attractive for the fabrication of high-power and high-frequency electronic devices, as well as of light-emitters and sensors which have to survive harsh operating conditions.

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Info:

Editors:
N. Wright, C.M. Johnson, K. Vassilevski, I. Nikitina and A. Horsfall
THEMA:
TGM
BISAC:
TEC021000
Details:
Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006
Pages:
1100
Year:
2007
ISBN-13 (hardcover):
9780878494422
ISBN-13 (CD):
9783908453697
ISBN-13 (eBook):
9783038131168
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Review from Ringgold Inc., ProtoView: Over the course of these two volumes, the editors (of the NASA Glenn Research Center, U. of South Florida, and U. of Pittsburgh) present 421 papers (35 being invited or plenary) from the September 2005 International Conference on Silicon Carbide and Related Materials, these materials being wide-bandgap semiconductors with properties that make them useful for the fabrication of high-power and high-frequency electronic devices, as well as light-emitters and sensors. The first volume contains papers that were presented in technical sessions on silicon carbide (SiC) bulk growth; SiC homoepitaxial, heteropolytic, and heteroepitaxial growth; physical properties and characterization issues including stacking faults, point defects, impurities, surfaces and interfaces, fundamental properties, and wafer mapping; and porous SiC and SiC nanoparticlses and nanowires. The second volume contains the papers from the technical sessions on implantation and doping of SiC, contacts, oxides, chemical-mechanical polishing of SiC, micromachining, and other processing topics; unipolar devices, bipolar devices, and sensors and detectors; III-nitrides (covering growth of III-nitrides, physical properties and characterization, surfaces and interfaces, and devices); and related materials.