Materials Science & Technology

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9/7/2009 - 9/10/2009
6/28/2009 - 7/3/2009

Simultaneous Determination of the Carrier Concentration, Mobility and Thickness of SiC Homo-Epilayers Using Terahertz Reflectance Spectroscopy

doi:10.4028/0-87849-442-1.423
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