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Nanowire Reconstruction on the 4H-SiC(1102) Surface

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Abstract:

Ordered reconstruction phases on the 4H-SiC(1102) surface have been investigated using low-energy electron diffraction (LEED), Auger electron spectroscopy (AES) and scanning tunneling microscopy (STM). After initial hydrogen etching, the samples were prepared by Si deposition and annealing in ultra-high vacuum (UHV). Two distinct reconstruction phases develop upon annealing, first with a (2×1), and at higher temperatures with a c(2×2) LEED pattern. After further annealing the fractional order LEED spots vanish and a (1x1) pattern develops. For the (2×1) phase, STM micrographs show that adatom chains develop on large flat terraces, which in view of AES consist of additional Si. These highly linear and equidistant chains represent a self-assembled well-ordered pattern of nanowires developing due to the intrinsic structure of the 4H-SiC(1102) surface. For the c(2×2) phase AES indicates a surface composition close to the bulk stoichiometry. For the (1×1) phase a further Si depletion is observed.

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Periodical:

Materials Science Forum (Volumes 556-557)

Pages:

529-532

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.556-557.529

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Online since:

September 2007

Authors:

M. Hetzel, Charíya Virojanadara, Wolfgang J. Choyke, Ulrich Starke

Keywords:

4H-SiC, AES, Auger Electron Spectroscopy (AES), LEED, Low-Energy Electron Diffraction, Nanowire, One-Dimensional Electronic State, Reconstruction, Scanning Tunneling Microscopy, SiC(1102), STM, Surface Structure

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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References

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