[1]
Allen, S.T., Sheppard, S.T., Pribble, W.L., Sadler, R.A., Alcom, T.S. Ring, Z., Palmour, J.W., Material Research Society Sypiosium Proceedings 572, (1999), p.3.
Google Scholar
[2]
Morrison, D.J., Wright, N.G., Horsfall, A.B., Johnson, C.M., O'Neill, A.G., Knights, A.P., Hilton, K.P., Uren, M.J., Solid State Electronics, 44 , (2000), p.1879.
DOI: 10.1016/s0038-1101(00)00177-5
Google Scholar
[3]
Saks, N.S., Aggarwal, A.K., App. Phys. Lett. 77/20, (2000), p.3281.
Google Scholar
[4]
Friedrichs, P., Mitlehner, H., Schorner, R., Kaltschmidt, R., Dohnke, K., Stephani, D., Mat. Sci. Forum, 353-356, (2001), 695.
DOI: 10.4028/www.scientific.net/msf.353-356.695
Google Scholar
[5]
Horsfall, A.B., Ortolland, S., Wright, N.G., Johnson, C.M., Knights, A.P., Mat. Sci. Forum, 353-356, (2001), 707.
DOI: 10.4028/www.scientific.net/msf.353-356.707
Google Scholar
[6]
Henning, J.P., Przadka, A., Melloch, M.R., Cooper, J.A., IEEE Electron Dev Lett, 21/12, (2000), p.578.
Google Scholar
[7]
Ortolland, S., Johnson, C.M., Wright, N.G., Morrison, D.J., Materials Science and Engineering, B61-62, (1999), 411.
Google Scholar
[8]
Goldberg, Y, Levinshtein, M., Rumyantsev, S., in `Properties of Advanced Semiconductor Materials`, Eds Leninshtein, M., Rumyantsev, S., Shur, M., Wiley, New York, (2001).
Google Scholar