Paper Titles
Structural Characterization of Thin 3C-SiC Films Annealed by the Flash Lamp Process
p.351
Study of Dislocation Mobility in 4H SiC by X-Ray Transmission Topography, Chemical Etching and Transmission Electron Microscopy
p.355
TEM of Dislocations in Forward-Biased 4H-SiC PiN Diodes
p.359
X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface
p.363
Structural Transformation of Dislocated Micropipes in Silicon Carbide
p.367
Deformation of 4H-SiC Single Crystals Oriented for Prism Slip
p.371
Inelastic Stress Relaxation in Single Crystal SiC Substrates
p.375
Dependence of Micropipe Dissociation on Surface Orientation
p.379
Analysis of Threading Dislocations in Wide-Bandgap Hexagonal Semiconductors by Energetic Approach
p.383

Structural Transformation of Dislocated Micropipes in Silicon Carbide

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Periodical:

Materials Science Forum (Volumes 457-460)

Pages:

367-370

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.457-460.367

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Online since:

June 2004

Authors:

Mikhail Yu. Gutkin, A.G. Sheinerman, T.S. Argunova, E.N. Mokhov, Jung Ho Je, Y. Hwu, W. Tsai

Keywords:

Computer Simulation, Micropipe, Radiography, Synchrotron Imaging

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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