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Articles by author: Emanuele Rimini

• Interaction and Migration Properties of Ion Beam Induced Point Defects in Crystalline Silicon: Basic Research and Technological Relevance
  Published in: Diffusion in Silicon (p137)
• Interferometric Quantum Sensors
  Published in: Smart Optics (p154)
• Memory Effects in Single-Electron Nanostructures
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p669)
• Micro- and Nano-Scale Electrical Characterization of Epitaxial Graphene on Off-Axis 4H-SiC (0001)
  Published in: Silicon Carbide and Related Materials 2011 (p637)
• Nanocrystal MOS with Silicon-Rich Oxide
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p675)
• Role of Ion Irradiation Induced Lattice Defects on Nanoscale Capacitive Behavior of Graphene
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p305)
• Structural Characterization of Graphene Grown by Thermal Decomposition of Off-Axis 4H-SiC (0001)
  Published in: HeteroSiC & WASMPE 2011 (p141)
• Surface Corrugation and Stacking Misorientation in Multilayers of Graphene on Nickel
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p125)
• Temperature Dependent Structural Evolution of Graphene Layers on 4H-SiC(0001)
  Published in: Silicon Carbide and Related Materials 2010 (p797)
• Ultra Low-Level Ion Implantation Damage Detected by p-n Junctions Biased above Breakdown
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p431)
• Void Shrinkage during Thermal Oxidation of Silicon
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p273)