HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by author: G. Kissinger

• Creation of Deep Denuded Zones in CZ Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p135)
• Cu Precipitation in Strained and Relaxing Ge_xSi_1-x Heteroepitaxial Layers
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p339)
• Defect Engineering in a High-Voltage Substrate Technology
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p175)
• Defects in AS-Grown Silicon and their Evolution During Heat Treatments
  Published in: Defects in Semiconductors 19 (p341)
• Delineation of Microdefects in Silicon Substrates by Chromium-Free Preferential Etching Solutions and Laser Scattering Tomography
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p443)
• Dislocation-Related Photoluminescence in Graded SiGe Buffer Layers Grown by APCVD
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p529)
• Equilibrium Critical Thickness of Strained Buried SiGe Layers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p149)
• Horizontal Versus Vertical Annealing of Silicon Wafers at High Temperatures
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p413)
• Infrared Studies of Oxygen Precipitation Related Defects in Silicon after Various Thermal Treatments
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p229)
• Lattice Defects in High Quality As-Grown CZ Silicon, Studied with Ligth Scattering and Preferential Etching Techniques
  Published in: Defects in Semiconductors 18 (p1755)
• Oxygen Precipitation in Nitrogen Doped CZ Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p17)
• Point Defects in SiGe Epitaxial Layers and Bulk Crystals
  Published in: Defects in Semiconductors 17 (p489)
• Precipitation Enhancement of "so Called" Defect-Free Czochralski Silicon Material
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p11)
• Rate Equation Modeling, Ab Initio Calculation, and High Sensitive FTIR Investigations of the Early Stages of Oxide Precipitation in Vacancy-Rich CZ Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p211)
• SOI by Silicon Wafer Direct Bonding - Problems of Wafer Warpage and Surface Chemistry
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p625)