HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by author: M.V. Zamoryanskaya

• Cathodoluminescence of SiO₂/Si System
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p487)
• Cathodoluminescence of the Composite Nanoscale Dendrite - Like GaAs-Ge Epitaxial Heterostructure
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p301)
• Cathodoluminescence Study of Defect Distribution at Different Depths in Films SiO₂/Si
  Published in: Beam Injection Assessment of Defects in Semiconductors (p237)
• Characterization of SiO₂/Si Interface by Cathodoluminescent Method
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p629)
• Far-Action Defects Formation and Gettering in 6H-SiC Lely Crystals Irradiated by Bi
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p401)
• Far-Action Radiation Defects and Gettering Effects in 4H-SiC Implanted with Al Ions
  Published in: Silicon Carbide and Related Materials 2008 (p473)
• Formation of Silicon Nanoclusters in Silicon Oxide Using an Electron Beam
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p349)
• High-Quality GaInAsSb and GaAlAsSb Layers for Thermophotovoltaics Grown by Liquid-Phase Epitaxy
  Published in: Nanostructured Materials, Thin Films and Hard Coatings for Advanced Applications (p87)
• Investigation of 4H-SiC Layers Implanted by Al Ions
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p53)
• Modification of Silicon Oxide by High Energy Electron Beam
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p729)
• Silicon Cluster Aggregation in Silica Layers
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p529)
• Silicon Nanoclusters in Thermal Oxide Films on Silicon
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p613)
• The Employment of Cathodoluminescent Method for Characterization of Silicon Oxide - Silicon Interface
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p649)