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Articles by author: Paolo Scardi

• A Computer Program for Structural Refinement from Thin Film XRD Patterns
  Published in: European Powder Diffraction 5 (p177)
• Analysis of Residual Stress-Texture Relationships in Thin Films
  Published in: THERMEC 2009 Supplement (p425)
• Application of the Rietveld Method to Phase Analysis of Multilayered Systems
  Published in: European Powder Diffraction (p57)
• Domain Size Analysis in the Rietveld Method
  Published in: Extending the Reach of Powder Diffraction Modelling (p187)
• Elastic Behaviour of Thin Stabilized-Zirconia Coatings
  Published in: European Powder Diffraction EPDIC 8 (p77)
• Elastic Constants of LPPS Stabilized-Zirconia Coatings
  Published in: Residual Stresses VI, ECRS6 (p431)
• Full Pattern Methods for the Analysis of Plastically Deformed Materials
  Published in: APPLIED CRYSTALLOGRAPHY XX (p27)
• Influence of Crystallite Size and Microstain on Structure Refinement
  Published in: European Powder Diffraction (p233)
• Line Profile Analysis in the Rietveld Method and Whole-Powder-Pattern Fitting
  Published in: European Powder Diffraction EPDIC 7 (p132)
• Low Temperature X-Ray Powder Diffraction of Ceria-Stabilized Zirconia
  Published in: European Powder Diffraction (p783)
• Microstructure and Phase Morphology of Diamond Thin Films by Synchrotron Radiation X-Ray Diffraction
  Published in: Advances in Crystal Growth (p285)
• Multicapillary Optics for Materials Science Studies
  Published in: European Powder Diffraction 6 (p162)
• On Faulting in Nanocrystallites of FCC Metals
  Published in: Residual Stresses VIII (p13)
• On the Modelling of Diffraction Line Profiles from Nanocrystalline Materials
  Published in: Applied Crystallography XXI (p19)
• Residual Stress Depth-Profiling in Shot-Peened Al Alloy Components Subjected to Fatigue Testing
  Published in: THERMEC 2009 (p2464)