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Papers by Author: Syunsuke Izumi

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Structure of In-Grown Stacking Faults in the 4H-SiC Epitaxial Layers

Authors: Syunsuke Izumi, Hidekazu Tsuchida, Takeshi Tawara, Isaho Kamata, Kunikaza Izumi

Abstract: We investigated the structure of the in-grown stacking faults (SFs) in the 4H-SiC epilayers. The in-grown SFs exhibited the photoluminescence (PL) peaks representing phonon replicas with bandgap of 2.710 eV. The in-grown SFs were confirmed to be triangular-shaped by PL mapping and KOH etch pit observation. High-resolution TEM image showed that the in-grown SFs have an identical stacking sequence that differ from single or double Shockley SF. In addition, the density of the in-grown SF depended on growth conditions.

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Analysis of Structural Defects in the 4H-SiC Epilayers and their Influence on the Electrical Properties

Authors: Syunsuke Izumi, Isaho Kamata, Takeshi Tawara, Hiroyuki Fujisawa, Hidekazu Tsuchida

1085

Evaluation of Free Carrier Lifetime and Deep Levels of the Thick 4H-SiC Epilayers

Authors: Takeshi Tawara, Hidekazu Tsuchida, Syunsuke Izumi, Isaho Kamata, Kunikaza Izumi

565

Dependence of Micropipe Dissociation on Surface Orientation

Authors: Isaho Kamata, Hidekazu Tsuchida, Syunsuke Izumi, Takeshi Tawara, Kunikaza Izumi

379

Growth and Characterization of the 4H-SiC Epilayers on Substrates with Different Off-Cut Directions

Authors: Hidekazu Tsuchida, Isaho Kamata, Syunsuke Izumi, Takeshi Tawara, Kunikaza Izumi

229

Suppression of Leakage Current Increase of 4H-SiC Schottky Barrier Diodes during High-Temperature Annealing by "Face-to-Face" Arrangement

Authors: Syunsuke Izumi, Hiroyuki Fujisawa, Takeshi Tawara, Katsunori Ueno, M. Hiraoka

685

Electroluminescence Analysis of Al⁺ and B⁺ Implanted pn Diodes

Authors: Hiroyuki Fujisawa, Takashi Tsuji, Syunsuke Izumi, Katsunori Ueno, Isaho Kamata, T. Tsuchida, Tamotsu Jikimoto, Kunikaza Izumi

1297

Analysis of High Leakage Currents in 4H-SiC Schottky Barrier Diodes Using Optical Beam-Induced Current Measurements

Authors: Takashi Tsuji, Syunsuke Izumi, A. Ueda, Hiroyuki Fujisawa, Katsunori Ueno, Hidekazu Tsuchida, Isaho Kamata, Tamotsu Jikimoto, Kunikaza Izumi

1141