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Articles by author: V.I. Vdovin

• Defect Formation in MBE Er-Doped Si Light-Emitting Structures
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p779)
• Dislocation Nucleation in Heteroepitaxial Semiconducting Films
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p251)
• Dislocation Related PL of Multi-Step Annealed Cz-Si Samples
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p773)
• Influence of Extended Structural Defects on the Characteristics of Electroluminescence in Efficient Silicon Light-Emitting Diodes
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p283)
• Misfit Dislocations in SiGe/Si Heterostructures: Nucleation - Propagation - Multiplication
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p483)
• Si Wafer Bonding: Structural Features of the Interface
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p85)
• Structural and Luminescent Properties of Implanted Silicon Layers with Dislocation-Related Luminescence
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p573)
• Structural Defects and Photoluminescence in Dislocation-Rich Erbium-Doped Silicon
  Published in: Defects in Semiconductors 19 (p1521)
• Very First Relaxation Steps in Low Temperature Buffer Layers SiGe/Si Heterostructures Studied by X-Ray Topography
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p77)