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Articles by author: W.C. Mitchel

• Comparison of Mechanical and Chemomechanical Polished SiC Wafers Using Photon Backscattering
  Published in: Silicon Carbide and Related Materials - 1999 (p841)
• Deep Level near E_C – 0.55 eV in Undoped 4H-SiC Substrates
  Published in: Silicon Carbide and Related Materials 2005 (p505)
• Deep Level Point Defects in Semi-Insulating SiC
  Published in: Silicon Carbide and Related Materials 2005 (p517)
• Deep Levels in SiC:V by High Temperature Transport Measurements
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p545)
• Deep Traps in High-Purity Semi-Insulating 6H-SiC Substrates: Thermally Stimulated Current Spectroscopy
  Published in: Silicon Carbide and Related Materials 2005 (p509)
• Electrical and Multifrequency EPR Study of Nitrogen and Carbon Antisite-Related Native Defect in n-Type As-Grown 4H-SiC
  Published in: Silicon Carbide and Related Materials - 2002 (p499)
• Electroluminescence of III-Nitride Double Heterostructure Light Emitting Diodes with Silicon and Magnesium Doped InGaN
  Published in: Defects in Semiconductors 19 (p1229)
• EPR, ESE and Pulsed ENDOR Study of Nitrogen Related Centers in 4H-SiC Wafers Grown by Different Technologies
  Published in: Silicon Carbide and Related Materials 2006 (p355)
• Evaluating and Improving SIMS Method for Measuring Nitrogen in SiC
  Published in: Silicon Carbide and Related Materials 2005 (p617)
• GaN Doped with Sulfur
  Published in: Defects in Semiconductors 19 (p1161)
• GaN Grown Using Trimethylgallium and Triethylgallium
  Published in: Defects in Semiconductors 19 (p1081)
• Ionization Energies and Electron Mobilities in Phosphorus- and Nitrogen-Implanted 4H-Silicon Carbide
  Published in: Silicon Carbide and Related Materials - 1999 (p703)
• MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC
  Published in: Silicon Carbide and Related Materials - 1999 (p707)
• Ni Graphite Intercalated Compounds in Ohmic Contact Formation on SiC
  Published in: Silicon Carbide and Related Materials 2005 (p863)
• Ohmic Contacts on p-Type SiC Using Al/C Films
  Published in: Silicon Carbide and Related Materials 2005 (p899)