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Articles by author: Z. Laczik

• An Examination of the Stability of Crystalline and Amorphous Silicon (Oxy) Nitride Fibres in an Oxide Matrix
  Published in: Nitrides and Oxynitrides (p243)
• Gettering of Copper and Nickel in Czochralski Silicon by Oxide Particles: Assessment of Thermal Stability
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p33)
• Gettering of Copper and Nickel in Czochralski Silicon by Oxide Particles: Dependence on Oxide Particle Density and Cooling Rate
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p39)
• Gettering of Low Concentration Copper, Nickel and Iron Contamination in Czochralski Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p177)
• Scanning Infra-Red Microscope Investigation of Oxide Particles in Czochralski Silicon Heat-Treated for Intrinsic Gettering
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p395)
• Study of Internal Oxide Gettering for CZ Silicon: Effects of Oxide Particle Size and Number Density and Assessment of Thermal Stability of Gettering for Copper and Nickel
  Published in: Defects in Semiconductors 16 (p1469)