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Articles by keyword: «Dangling Bond»

• SiC/SiO₂ Interface States: Properties and Models
  Published in: Silicon Carbide and Related Materials 2004 (p563)
• (11-20) Face Channel MOSFET with Low On-Resistance
  Published in: Silicon Carbide and Related Materials 2007 (p1119)
• A High-Resolution Photoemission Study of Hydrogen-Terminated 6H-SiC Surfaces
  Published in: Silicon Carbide and Related Materials 2001 (p713)
• Analytical Model for Recombination Mechanism in Amorphous Silicon P-I-N Solar Cell
  Published in: Disordered Materials (p241)
• Applications of the Modulated Photocurrent Technique to the Determination of Gap States Characteristics in Hydrogenated Amorphous Silicon
  Published in: Hydrogenated Amorphous Silicon (p597)
• Defects in Porous Silicon: A Study with Optical and Spin Resonance Methodes
  Published in: Defects in Semiconductors 18 (p1673)
• EB Induced Stress Relaxation of Tight Network Structure in Silica and Soda Glasses
  Published in: New Frontiers of Processing and Engineering in Advanced Materials (p385)
• Electrically Detected ESR Study of Interface Defects in 4H-SiC Metal-Oxide-Semiconductor Field Effect Transistor
  Published in: Silicon Carbide and Related Materials 2010 (p370)
• Identification of VH in Silicon by EPR
  Published in: Defects in Semiconductors 19 (p515)
• Improvements in the Electrical Performance of High Voltage 4H-SiC Schottky Diodes by Hydrogen Annealing
  Published in: Silicon Carbide and Related Materials 2000 (p691)
• Influence of Intrinsic Defects on the Electronic Structure of Non-Stoichiometric CuInS₂ Chalcopyrite Semiconductors
  Published in: Defects in Semiconductors 18 (p1667)
• Interaction of Point Defects with Dislocations in Silicon and Germanium: Electrical and Optical Effects
  Published in: Defect Interaction and Clustering in Semiconductors (p67)
• Mechanism of Ultrasonic Enhanced Hydrogenation in Poly-Si Thin Films
  Published in: Defects in Semiconductors 19 (p197)
• Mechanisms of the Reversible Electrochemical Insertion of Lithium Occuring with NCIM_s (Nano-Crystallite-Insertion-Materials)
  Published in: Soft Chemistry Routes to New Materials (p217)
• Modelling and Optimisation of Poly-Si Thin Film Transistors for Flat Panel Displays
  Published in: Polycrystalline Semiconductors III (p571)