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Articles by keyword: «Depth Profiling»

• Characterization of Intermetallic Layer with Nanoresolution Using X-Ray Standing Wave Technique
  Published in: Diffusion in Materials - DIMAT2008 (p369)
• Computer Simulation and Depth Profiling of Light Nuclei by Nuclear Techniques
  Published in: Energy and Environment Engineering and Management (p123)
• Concentration of N and P in SiC Investigated by Time-Of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
  Published in: Silicon Carbide and Related Materials 2004 (p453)
• Depth-Profiling of Phase Composition and Texture in Layered-Graded Al₂O₃- & Ti₃SiC₂-Based Systems Using X-Ray and Synchrotron Radiation Diffraction
  Published in: High-Performance Ceramics 2001 (p505)
• Intermixing in Cu/Co: Molecular Dynamics Simulations and Auger Electron Spectroscopy Depth Profiling
  Published in: Diffusion and Stresses (p19)
• Layered and Graded Alumina-Based Hybrid Composites by Infiltration Processing
  Published in: High-Performance Ceramics 2001 (p493)
• Model-Free Deconvolution of Depth Profiles Obtained by Positron Beams of Variable Energy
  Published in: Positron Annihilation - ICPA-10 (p185)
• Reconstruction of Stress and Composition Profiles from X-Ray Diffraction Experiments — How to Avoid Ghost Stresses?
  Published in: European Powder Diffraction EPDIC 8 (p91)
• Surface Segregation of Indium by Heat Treatment of Aluminium
  Published in: Aluminium Alloys 2006 - ICAA10 (p673)