Scientific.Net: Materials Science

Paper Title	Page
Allowance for Anisotropic Line Broadening in the Crystal Structure Solution of [Pd(NH₃)₄][Pd(C₂O₄)₂] Authors: L.A. Solovyov	885
Analysis of Strain Fields by Means of Diffraction-Line Broadening Authors: J.G.M. Van Berkum, Rob Delhez, T.H. de Keijser, Eric J. Mittemeijer	11
Anisotropic Line Broadening from Stacking Faults in Rietveld Refinement Authors: L.A. Solovyov	28
Diffraction Methods for the Characterisation of Defects in Intermetallic Compounds Authors: Luca Lutterotti, Stefano Gialanella, R. Caudron	551
Dislocation Microstructures Identification by X-Ray Diffraction-Line Broadening Analysis Authors: Hakim Bougrab, Karim Inal, Marcel Berveiller	133
Effect of Hydrostatic Pressure on the Microstructure and Mechanical Properties during and after High Pressure Torsion Authors: Erhard Schafler	657
Evaluation of Deformation Behavior in Cu Thin Film under Tensile and Fatigue Loading by X-Ray Method Authors: Yoshiaki Akiniwa, Tsuyoshi Suzuki, Keisuke Tanaka	807
In Situ X-Ray Stress Measurement in Electrodeposited Cu Foils under Tensile and Fatigue Loading Authors: Yoshiaki Akiniwa, Tsuyoshi Suzuki, K. Tanaka	2395
Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties Authors: Juan Rodríquez-Carvajal, T. Roisnel	123
Line Broadening of Phonons in the Raman Spectra of Isotopically Disordered SiC Authors: S. Rohmfeld, Martin Hundhausen, Lothar Ley, Norbert Schulze, Gerhard Pensl	341

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