Papers by Keyword: Line Broadening

Abstract: Titanium alloys are used in a wide variety of aerospace, energy, industrial and biomedical applications, among other reasons, due to their superior properties. These properties are highly dependent of materials microstructure, i.e. texture, dislocation density and slip system activity. Therefore, in order to be able to design materials with certain properties it is crucial an understanding of the deformation process in terms of microstructural parameters. Microstructure evolution in warm rolled commercially pure titanium was investigated by means of X-ray diffraction and modeled with a crystal plasticity self-consistent scheme. Texture measurements and peak profile analysis were used to characterize the deformation texture and evaluate the relative activity of the various slips systems activated during the deformation process. The peak profile analysis data and the self-consistent predictions of texture evolution showed a good agreement with the experimental deformation texture evolution.

Abstract: The presence of a hydrostatic pressure as a general feature of SPD methods is essential for achieving the high strains and the introduction of the high amount of lattice defects, which are necessary to establish new grain boundaries. Systematic investigations of High Pressure Torsion (HPT)-deformed Cu under variation of strain and hydrostatic pressure revealed marked differences between the in-situ torsional stress (torque measurement) and the post-HPT strength of the ultrafine-grained materials. These facts let assume the occurrence of relaxation processes (recovery/recrystallisation) of static character with respect to the release of the hydrostatic pressure after straining. In order to gain insight into the processes behind, a special experimental procedure was designed to simulate the hydrostatic pressure release. Investigations by X-ray line profile analysis and hardness measurement show marked influences of the pressure release on microstructure and strength. While the size of the coherently scattering domains is not strongly affected, the dislocation density decreases drastically and the arrangement of the dislocations within the subgrain structure changes to a less stress intensive one, upon the pressure release. In parallel the hardness decreases significantly and confirms the discrepancy between in-situ torque-stress and post-HPT strength.

Abstract: Thin films of CdSe were electrodeposited on tin oxide coated conducting glass substrates at various bath temperatures. The deposited films were characterized by x-ray diffraction (XRD) and scanning electron microscopy (SEM). X-ray diffraction studies revealed that the deposited films are found to be hexagonal structure with preferential orientation along (002) plane. The microstructural parameters such as crystallite size, R.M.S strain, dislocation density, stacking fault probability were calculated using x-ray line profile analysis technique. The variation of microstructural parameters with bath temperature and film thickness were studied and discussed.

Abstract: Monotonic and cyclic loadings were subjected to electrodeposited copper foils (thickness is 8 and 20 μm), and the deformation behavior was observed. In-situ X-ray stress measurement was carried out under monotonic loading. The tensile strength of 8 μm foil was higher than that of 20 μm foil. On the other hand, the elongation of 8 μm foil was smaller. When the plastic deformation occurred, difference between the X-ray stress and the applied stress became large. The difference of 20 μm foil was larger than that of 8 μm foil. Fatigue strength of 8 μm foil was also higher than that of 20 μm foil. The value of the full width at half maximum, FWHM, increased dramatically at the first cycle, and then the value became nearly constant. Just before fracture, the value increased again. The change in FWHM corresponded to the change in the accumulated ratchet strain.

Abstract: Two kinds of electrodeposited copper foils (thickness is 8 and 20 μm) were loaded statically, and the deformation behavior was observed. In-situ X-ray stress measurement was carried out under tensile loading. Fatigue tests were also conducted to observe the effect of the thickness on the fatigue strength. Change in the line broadening with stress cycles was observed to evaluate the fatigue damage. The tensile strength of 8 μm foil was higher than that of 20 μm foil. When the foils were loaded within elastic region, the stress measured by the X-ray method agreed with applied stress. When the plastic deformation occurred, difference between the measured stress and the applied stress became large. The difference of 20 μm foil was larger than that of 8 μm foil. Fatigue strength of 8 μm foil was also higher than that of 20 μm foil. The value of the full width at half maximum, FWHM, increased rapidly at the first cycle, and then the value became nearly constant. Just before fracture, the value increased again. The change in FWHM corresponded to the change in the accumulated ratchet strain.

Abstract: All methods of analyzing the broadening of XRD line profiles have to take into account two basic effects: broadening by the instrument - including the X-ray spectrum - and the characteristics of broadening by size effects and by lattice defects - including their interaction. These effects are handled in practice by a wide range of auxiliary assumptions. In this paper these assumptions and their quality with respect to "appropriateness of purpose" are listed and compared. By systematic ranking of these assumptions in accordance with their quality, a 2-dimensional map can be constructed that visualizes the differences in the quality of the assumptions. This 2-dimensional map brings a new viewpoint to the various methods for line profile analysis, because it enables a qualitative comparison of the assumptions of existing methods and new developments.

Abstract: A short account of the methodology used within FullProf to extract average micro-structural properties from the analysis of broadened lines of constant wavelength diffraction patterns is presented. The approach is based on the Voigt approximation and can be combined with the Rietveld method as well as with the profile matching (Le Bail fit) procedure. Both the instrumental and sample profiles are supposed to be well described by Voigt functions. To get reliable sample parameters a good knowledge of the Instrumental Resolution Function (IRF) is needed. Only a phenomenological treatment, in terms of coherent size domains and strains due to structural defects, is performed.