Study of the Light Source Affects the Second Order Moiré Fringe Quality of Nano-Grating

Article Preview

Abstract:

Two groups of indicator grating and scale grating produce two groups of first order Moiré fringe. Two groups of first order Moiré fringe interfere and produce second order Moiré fringe, and then by signal measurement and subdivide to the second order Moiré fringe, we can achieve nanometer accuracy. In which, the quality of the second order Moiré fringe has important influence on the quality of the nano-grating quality. In the second order Moiré fringe formation process, the characteristic of light source, the manufacture and assembling accuracy of scale grating and indicator grating and optical system, interference and noise etc. have an important influence on the quality of the second order Moiré fringe. This paper study the change of light source properties which formed the second order Moiré fringe to the quality of the second order Moiré fringe based on Lighttools software simulation. In order to provide a theoretical evidence for optimize design of the light source.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

57-62

Citation:

Online since:

September 2011

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Richardson Grating Laboratory. Diffraction Grating Handbook. 6th edition. (2008).

Google Scholar

[2] C. Palmer, W. Mckinney and B. Wheeler. Imaging Equations for Spectroscopic Systems Using Lie transformations. Proc. SPIE[C]. 1998, 3450: 55-56.

Google Scholar

[3] E.K. Popov, E.G. loewen and M. Nevicre. Transmission Grating for Beam Sampling and Beam Splitting. Applied Optics[J]. 1996, 35: 3072-3075.

DOI: 10.1364/ao.35.003072

Google Scholar

[4] Yu Wenxin, Hu Xiaotang etc. The System Error Correct Technology Research Of Grating Nanometer Measurement[J]. ACTA METROLOGICAL SINICA, 2002(2): 100-105.

Google Scholar

[5] Ma Xiushui, Fei Yetai, Chen Xiaohuai, Zhao Jing. Theory Study of a New Nanometrology Grating. Chinese Journal of Scientific Instrument, 2006(2), 159-164.

Google Scholar

[6] Chu Xinchun. Research of Key Technology on Nanometrology Grating Interference Dsplacement Masurement[D]. Doctoral Dissertation of National Defence University of Technology, (2005).

Google Scholar

[7] Zhao Kaihua, Zhong Xihua. Optics[M]. Beijing: Press of Beijing University, (2005).

Google Scholar

[8] Ma Xiushui, Zhong Weihong, Guan Hongwei, Yan Rusheng, Fei Yetai. Optical System Signal Simulation of Nanometer Grating Based on Second Order Moiré Fringe. Journal of Scientific Instrument, 2009(6), supplement, 442-445.

Google Scholar